Yield and reliability in microwave circuit and system design
Title
: 
Yield and reliability in microwave circuit and system design

Personal Author
: 
Meehan, Michael D.

Publication Information
: 
Boston : Artech House, 1993

ISBN
: 
9780890065273

Subject Term
: 
Microwave integrated circuits -- Design and construction -- Statistical methods
 
Engineering design -- Statistical methods
 
Computer-aided design

Added Author
: 
Purviance, John


LibraryItem BarcodeCall NumberMaterial TypeItem Category 1
PSZ JB30000002860157TK7876.M43 1993Open Access BookBook