Analysis of the wavelet-based image difference algorithm for PCB inspection
Title
: 
Analysis of the wavelet-based image difference algorithm for PCB inspection

Personal Author
: 
Zuwairie Ibrahim

Series
: 
Siri kertas kerja penyelidikan (Universiti Teknologi Malaysia. Pusat Pengurusan Penyelidikan)

Publication Information
: 
Skudai : Universiti Teknologi Malaysia, 2002

Subject Term
: 
Printed circuits -- Inspection
 
Printed circuits -- Design and construction
 
Electronic circuits
 
Image transmission
 
Wavelets (Mathematics)

Added Author
: 
Syed Abdul Rahman Syed Abu Bakar
 
Zulfakar Aspar

Added Conference Author
: 
SICE 2002 (2002 : Osaka, Japan)


LibraryItem BarcodeCall NumberMaterial TypeItem Category 1
Perpustakaan Raja Zarith Sofiah30000004779728TK7868.P7 Z89 2002Closed Access Book1:BOOK_ARC
PSZ JB30000004779736TK7868.P7 Z89 2002Open Access BookProceedings, Conference, Workshop etc.
PSZ KL30000004779744TK7868.P7 Z89 2002Open Access BookBook