Image processing and pattern recognition in remote sensing II : 8-9 November, 2004, Honolulu, Hawaii, USA
Title
: 
Image processing and pattern recognition in remote sensing II : 8-9 November, 2004, Honolulu, Hawaii, USA

Series
: 
SPIE proceedings series, 5657

Publication Information
: 
New York, NY : SPIE, 2005

Physical Description
: 
viii, 128 p. : ill., maps ; 28 cm.

ISBN
: 
9780819456182

Subject Term
: 
Earth sciences -- Remote sensing -- Congresses
 
Remote sensing -- Congresses

Added Author
: 
Yasuoka, Yoshifumi
 
Ungar, S. G.

Added Corporate Author
: 
Society of Photo-Optical Instrumentation Engineers
 
United States. National Aeronautics and Space Administration


LibraryItem BarcodeCall NumberMaterial TypeItem Category 1
PSZ JB30000010221530QE33.2.R4 I53 2005Open Access BookBook