Scanning probe microscopy : electrical and electromechanical phenomena at the nanoscale
Title
: 
Scanning probe microscopy : electrical and electromechanical phenomena at the nanoscale

Publication Information
: 
New York, NY : Springer, 2007

Physical Description
: 
2v.

ISBN
: 
9780387286679

General Note
: 
Available online version

Subject Term
: 
Scanning probe microscopy
 
Nanoelectronics

Added Author
: 
Kalinin, S.V. (Sergei Vasil)
 
Gruverman, A. (Alexei)

Electronic Access
: 
Fulltext


LibraryItem BarcodeCall NumberMaterial TypeItem Category 1
PSZ JB30000010126331QH212.S33 S32 2007 issue.1Open Access BookGreat Book
PSZ JB30000010126330QH212.S33 S32 2007 issue.2Open Access BookGreat Book