Analog IC reliability in nanometer CMOS
Title
:
Analog IC reliability in nanometer CMOS
Personal Author
:
Maricau, Elie
Series
:
Analog circuits and signal processing series
Publication Information
:
New York, NY. : Springer, 2013
Physical Description
:
xvi, 198 p. : ill. ; 24 cm.
ISBN
:
9781461461623
Subject Term
:
Linear integrated circuits -- Reliability
Metal oxide semiconductors, Complementary
Nanoelectronics
Transistors -- Reliability -- Computer simulation
Added Author
:
Gielen, Georges
Library | Item Barcode | Call Number | Material Type | Item Category 1 |
---|
PSZ JB | 30000010335716 | TK7871.99.M44 M374 2013 | Open Access Book | Book |