Analog IC reliability in nanometer CMOS
Title
: 
Analog IC reliability in nanometer CMOS

Personal Author
: 
Maricau, Elie

Series
: 
Analog circuits and signal processing series

Publication Information
: 
New York, NY. : Springer, 2013

Physical Description
: 
xvi, 198 p. : ill. ; 24 cm.

ISBN
: 
9781461461623

Subject Term
: 
Linear integrated circuits -- Reliability
 
Metal oxide semiconductors, Complementary
 
Nanoelectronics
 
Transistors -- Reliability -- Computer simulation

Added Author
: 
Gielen, Georges


LibraryItem BarcodeCall NumberMaterial TypeItem Category 1
PSZ JB30000010335716TK7871.99.M44 M374 2013Open Access BookBook