Built-In-Self-Test (BIST) pattern generation for circuit under test
Title
: 
Built-In-Self-Test (BIST) pattern generation for circuit under test

Personal Author
: 
Noor Hidayah Tauhid Ahmad

Publication Information
: 
2005

Physical Description
: 
xiii, 120p. : ill. ; 30 cm.

General Note
: 
Supervisor : Ismail Ariffin

Subject Term
: 
Electrical engineering
 
System analysis

Added Author
: 
Ismail Ariffin

Added Corporate Author
: 
Fakulti Kejuruteraan Elektrik

Project Paper (Sarjana Muda Kejuruteraan (Elektrik - Komputer)) - Universiti Teknologi Malaysia, 2005


LibraryItem Barcode[[missing key: search.ChildField.CALLNUMBER]]Material TypeItem Category 1
FKE LibraryFKE30000001873Closed Access ThesisUTM Project Paper (Closed Access)
Perpustakaan Raja Zarith Sofiah30000010097133TK153 N66 2005 rafClosed Access ThesisUTM Project Paper (Closed Access)