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1. 
Cover image for Extreme environment electronics
2. 
Cover image for ISTFA 2013 : conference proceedings from the 39th International Symposium for Testing and Failure Analysis, November 3-7, 2013, San Jose Convention Center, San Jose, California, USA
3. 
Cover image for Microelectronics failure analysis desk reference
4. 
Cover image for Failure analysis : a practical guide for manufacturers of electronic components and systems
5. 
Cover image for Microelectronics failure analysis : desk reference
6. 
Cover image for Lock-in thermography : basics and use for evaluating electronic devices and materials
7. 
Cover image for Practical guide to inspection, testing and certification of electrical installations : conforms to 17th edition IEE wiring regulations (BS 7671 : 2008) and part P of building regulations
8. 
Cover image for Practical guide to inspection, testing and certification of electrical installations : conforms to IEE wiring regulations / BS 7671 / part P of building regulations
9. 
Cover image for PAT : portable appliance testing : in-service inspection and testing of electrical equipment
10. 
Cover image for Inspection, testing and certification : including periodic reporting
11. 
Cover image for A signal integrity engineer's companion : real-time test and measurement and design simulation
12. 
Cover image for Electrician's troubleshooting and testing pocket guide
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