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British Standards Institution
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Integrated circuits -- Testing
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Digital integrated circuits -- Testing
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1. 
Cover image for Design, fabrication and testing of integrated circuits
2. 
Cover image for Testing for small-delay defects in nanoscale CMOS integrated circuits
3. 
Cover image for Wafer-level testing and test during burn-in for integrated circuits / Sudarshan Bahukudumbi, Krishnendu Chakrabarty
4. 
Cover image for Power supply voltage control testing technique as a novel electrical test strategy for analogue integrated circuits
5. 
Cover image for Power supply voltage control testing technique as a novel electrical test strategy for analogue integrated circuits; Telechelic natural rubber oligomers via controlled ozonolysis; Symbolic manipulations related to certain aspects such interpretations of graphs; A study of vibrational power flow in fibre-reinforced plastic material; Ultrasound fields in crossflow microfiltration
6. 
Cover image for Automatic testing and evaluation of digital integrated circuits
7. 
Cover image for The effects of backdriving digital integrated circuits during in-circuit testing
8. 
Cover image for Testability method at register transfer level (RTL) and gate level
9. 
Cover image for Testability method at register transfer level (RTL) and gate level
10. 
Cover image for Test vectors reduction for integrated circuit testing using horizontal hamming distance
11. 
Cover image for Test vectors reduction for integrated circuit testing using horizontal hamming distance
12. 
Cover image for Crystal growth and evaluation of silicon for VLSI and ULSI
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