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Cover image for Gate-all-around floating-gate (GAA-FG) with variable oxide thickness for nonvolatile memory
2. 
Cover image for Gate-all-around floating-gate (GAA-FG) with variable oxide thickness for nonvolatile memory
3. 
Cover image for Crystal growth and evaluation of silicon for VLSI and ULSI
4. 
Cover image for Materials Characterisation VII
5. 
Cover image for Testing for small-delay defects in nanoscale CMOS integrated circuits
6. 
Cover image for Channel length effects on the characteristic of submicron nLDD-mosfet exposed to gamma radiation
7. 
Cover image for Channel length effects on the characteristic of submicron nLDD-mosfet exposed to gamma radiation
8. 
Cover image for Functional test generation using micro operation fault model
9. 
Cover image for Microelectronics failure analysis desk reference
10. 
Cover image for Advanced calculations for defects in materials : electronic structure methods
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Cover image for Functional test generation using micro operation fault model
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Cover image for Microelectronics failure analysis : desk reference
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