Limit Search Results
Author
The International Society for Optical Engineering
(48)
SPIE (Society)
(21)
Society of Photo-Optical Instrumentation Engineers
(10)
Society of Photo-optical Instrumentation Engineers
(7)
SPIE Europe
(3)
Language
Format
Material Type
Subject
Photonics -- Congresses
(8)
Fiber optics -- Congresses
(7)
Nanostructured materials -- Congresses
(6)
Nanotechnology -- Congresses
(6)
Optical detectors -- Congresses
(5)
Switch to list view
Switch to thumbnail view
90 Results Found Subscribe to search results
000000000000MAIN
Print
1. 
Cover image for Reliability of optical fibers and optical fiber systems : proceedings of a conference held 20-21 September 1999, Boston, Massachusetts, sponsored by SPIE--The International Society for Optical Engineering
2. 
Cover image for Collected papers of the international conferences on optical fiber sensors (OFS), 1983-1997 selected SPIE papers
3. 
Cover image for Laser-induced damage in optical materials : collected papers, 1969-1998
4. 
Cover image for Quantum dots and nanostructures : synthesis, characterization, and modeling IX : 24-25 January 2012, San Francisco, California, United States
5. 
Cover image for Medical imaging 2012. Physics of medical imaging, 5-8 February 2012, San Diego, California, United States
6. 
Cover image for Quantum sensing and nanophotonic devices VIII : 23-27 January 2011, San Francisco, California, United States
7. 
Cover image for Quantum dots and nanostructures : synthesis, characterization, and modeling VIII : 25-26 January 2011, San Francisco, California, United States
8. 
Cover image for Quantum information and computation IX : 28-29 April 2011, Orlando, Florida, United States
9. 
Cover image for Nanophotonic materials VIII : 24-25 August 2011, San Diego, California, United States
10. 
Cover image for Nanostructured thin films IV : 23-25 August 2011, San Diego, California, United States
11. 
Cover image for Nano-opto-mechanical systems (NOMS) : 21 August 2011, San Diego, California, United States
12. 
Cover image for Polarization : measurement, analysis, and remote sensing IX : 7-8 April, 2010, Orlando, Florida, USA
Go to:Search Results
|
Top of Page
|
Search Facets