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1. 
Cover image for Modified pattern generator of built-in self test for sequential circuits with reduced test time
2. 
Cover image for Modified pattern generator of built-in self test for sequential circuits with reduced test time
3. 
Cover image for Nanometer technology designs : high quality delay tests
4. 
Cover image for Defect-oriented testing for nano-metric CMOS VLSI circuits
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Cover image for Wireless IC testing on FPGA platform
6. 
Cover image for VLSI test principles and architectures : design for testability
7. 
Cover image for An experimental approach to CDMA and interference mitigation : from system architecture to hardware testing through VLSI design
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Cover image for Verification by error modeling : using testing techniques in hardware verification
9. 
Cover image for Rekabentuk sistem siaraya
10. 
Cover image for Essentials of electronic testing for digital, memory and mixed - signal VLSI circuits
11. 
Cover image for IC test process simulation
12. 
Cover image for Penentuan gangguan peralatan telekomunikasi sistem digital gelombang mikro di Malaysia ... [et al.]