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Cover image for Principles and analysis of AIGaAS/GaAs heterojunction bipolar transistors
Title:
Principles and analysis of AIGaAS/GaAs heterojunction bipolar transistors
Personal Author:
Publication Information:
Boston, Mass. : Artech House, 1996
ISBN:
9780890065877

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Item Category 1
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30000004687020 TK7871.96.B55 L56 1996 Open Access Book Book
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Summary

Summary

The first book devoted entirely to HBTs, this reference examines the basic concept, standard and advanced structures, noise performance, reliability issues, and simulation. It's main emphasis is on device physics and its mathematical representations, through which the operational characterization of AlGaAs/GaAs HBTs can be understood.


Table of Contents

Introduction
Abrupt AlGaAs/GaAs HBT
Collector and Base Current in Abrupt HBT
Cutoff Frequency
Avalanche Multiplication Characteristics
Enhanced Structures, Base Grading, Setback Layer, and Graded Layer
Combined Effect of Setback and Graded Layers
Thermal Effect in AlGaAs/GaAs HBT
Self-Heating and Thermal Coupling Effects in Multiple-Emitter Finger HBT
Thermal-Avalanche Interacting Behavior
Base and Collector Leakage Currents
Leakage Currents at the Emitter-Base, Base-Collector, and Collector-Subcollector Peripheries, and the Subcollector-Substrate Interface
Base and Collector Currents Including Normal and Leakage Components
Leakage Current Characteristics in Post-Burn
Noise and High-Frequency Noise Characteristics
Overview of 1/F, Burst, and Shot Noise
Numerical Simulation
Overview of Two-Dimensional Device Simulator MEDICI
Effects of Graded Layer, Setback Layer, and Self-Heating
Effects of Different Base and Collector Structures
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