Title:
Electronic packaging and interconnection handbook
Edition:
3rd ed.
Publication Information:
New York : McGraw-Hill, 2000
ISBN:
9780071347457
Subject Term:
Added Author:
Available:*
Library | Item Barcode | Call Number | Material Type | Item Category 1 | Status |
---|---|---|---|---|---|
Searching... | 30000004759308 | TK7870.15 H37 2000 | Open Access Book | Book | Searching... |
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Table of Contents
Preface | p. xi |
Electronic Packaging Defined | p. xiii |
Contributors | p. xiv |
Part 1 Fundamental Technologies | |
Chapter 1. Materials for Electronic Packaging | |
Polymers for Electronic Packaging | |
1.1 Introduction | p. 1.1 |
1.2 Future Electronic Packaging System Needs | p. 1.2 |
1.3 Recent Advancements in Polymeric Materials for Electronic Packaging | p. 1.2 |
1.4 Polymeric Materials For Microelectronics | p. 1.3 |
1.5 Conclusions and Future Developments | p. 1.15 |
Bibliography | p. 1.15 |
Flip Chip Technology: Materials and Processes for the Next Generation of High-Performance Electronics | |
1.6 Basics | p. 1.22 |
1.7 Under-Bump Metallization | p. 1.24 |
1.8 Bumping Materials | p. 1.27 |
1.9 Bumping Processes | p. 1.30 |
1.10 Joining Materials and Agents | p. 1.34 |
1.11 The Assembly Process | p. 1.38 |
1.12 Encapsulation/Underfill | p. 1.41 |
1.13 Substrates for Flip Chips | p. 1.46 |
1.14 Features and Benefits | p. 1.48 |
1.15 Limitations and Issues | p. 1.49 |
1.16 Performance and Reliability | p. 1.51 |
1.17 Applications | p. 1.51 |
1.18 Summary and Conclusions | p. 1.53 |
References | p. 1.54 |
Ceramic Materials | |
1.19 Introduction | p. 1.58 |
1.20 Classes of Materials Covered | p. 1.65 |
1.21 Summary--Ceramics | p. 1.93 |
References | p. 1.93 |
Chapter 2. Thermal Management | |
2.1 Introduction | p. 2.1 |
2.2 Why Thermal Management? | p. 2.2 |
2.3 Heat Flow Theory | p. 2.5 |
2.4 The Thermal Design | p. 2.35 |
2.5 Heat Sinks | p. 2.36 |
2.6 Circuit Card Assembly Cooling | p. 2.50 |
2.7 High heat-load cooling | p. 2.57 |
2.8 Special cooling devices | p. 2.66 |
2.9 Computer-Based Thermal Analysis | p. 2.75 |
2.10 Thermal Measurements | p. 2.79 |
References | p. 2.90 |
Chapter 3. Thermal and Mechanical Stress Behavior in Electronic Packaging | |
3.1 Introduction | p. 3.1 |
3.2 Stress Generation and Fatigue | p. 3.2 |
3.3 Stress Environments | p. 3.5 |
3.4 Material Mechanical Properties | p. 3.8 |
3.5 Soft Solder Fatigue | p. 3.12 |
3.6 Mechanical and Thermomechanical Models | p. 3.13 |
3.7 Modified Coffin-Manson Equations | p. 3.18 |
3.8 Miner's Rule | p. 3.20 |
3.9 FEM Package Representation | p. 3.22 |
3.10 Thermal Analysis Using FEM | p. 3.24 |
3.11 Total Inelastic Strain Energy | p. 3.25 |
3.12 Crack Growth Theory | p. 3.25 |
3.13 Temperature Dependence of Properties | p. 3.27 |
3.14 Packaging Fatigue | p. 3.28 |
3.15 Die Cracking and Delamination | p. 3.28 |
3.16 Flip Chips | p. 3.31 |
3.17 Ball Grid Arrays | p. 3.36 |
3.18 Chip on Board | p. 3.37 |
3.19 Level-Two Packaging--Pin-in-Hole | p. 3.39 |
3.20 Leadless and Leaded Quad Packages | p. 3.40 |
3.21 FEM Stress Analysis of Temperature-Cycled LCCC Solder Joints | p. 3.42 |
3.22 Leaded Chip Carriers (Quad Flat Packages) | p. 3.45 |
3.23 Summary | p. 3.46 |
References | p. 3.47 |
Chapter 4. Connector and Interconnection Technology | |
4.1 Connector Overview | p. 4.1 |
4.2 The Contact Interface | p. 4.6 |
4.3 The Contact Finish | p. 4.10 |
4.4 Contact Springs | p. 4.17 |
4.5 Connector Housings | p. 4.21 |
4.6 Separable Connections | p. 4.27 |
4.7 Permanent Connections | p. 4.33 |
4.8 Connector Applications | p. 4.49 |
4.9 Connector Types | p. 4.55 |
4.10 Connector Testing | p. 4.72 |
References | p. 4.80 |
Chapter 5. Wiring and Cabling | |
5.1 Introduction | p. 5.1 |
5.2 Cabling Types | p. 5.2 |
5.3 Basic Construction | p. 5.4 |
5.4 Connector Characteristics | p. 5.45 |
5.5 Electromagnetic Interference and Shielding | p. 5.47 |
References | p. 5.55 |
Chapter 6. Solder Technologies for Electronic Packaging and Assembly | |
6.1 Introduction | p. 6.1 |
6.2 Solder Materials | p. 6.6 |
6.3 Solder Paste | p. 6.23 |
6.4 Soldering Methodology | p. 6.31 |
6.5 Solderability | p. 6.50 |
6.6 Cleaning | p. 6.52 |
6.7 Fine-Pitch Application | p. 6.53 |
6.8 Soldering-Related Issues | p. 6.57 |
6.9 Solder-Joint Appearance and Microstructure | p. 6.66 |
6.10 Solder-Joint Integrity | p. 6.71 |
6.11 Lead-Free Solders | p. 6.78 |
References | p. 6.82 |
Part 2 Interconnection Technologies | |
Chapter 7. Packaging and Interconnection of Integrated Circuits | |
7.1 Introduction | p. 7.1 |
7.2 Conventional Package Technologies | p. 7.20 |
7.3 Advanced Package Technologies | p. 7.45 |
7.4 Comparison of Technologies | p. 7.59 |
7.5 Package Families | p. 7.61 |
7.6 Package Design Considerations | p. 7.67 |
7.7 Package IC Assembly Processes | p. 7.77 |
7.8 Outsourcing--Subcontract Assembly | p. 7.91 |
7.9 Package to Second-Level Interconnection | p. 7.94 |
7.10 Summary and Future Trends | p. 7.95 |
References | p. 7.97 |
Chapter 8. Surface Mount Technologies | |
8.1 Introduction | p. 8.1 |
8.2 The Challenges of SMT | p. 8.2 |
8.3 Engineering Skills | p. 8.8 |
8.4 Electronics Packaging Families | p. 8.12 |
8.5 SMT Design for Manufacture | p. 8.26 |
8.6 Materials Impact on Process | p. 8.34 |
8.7 Process Guidelines for SMT Manufacturing | p. 8.41 |
8.8 Inspection and Quality Assurance | p. 8.72 |
8.9 Reliability | p. 8.78 |
References | p. 8.87 |
Chapter 9. The Hybrid Microelectronics and Multichip Module Technologies | |
9.1 Introduction | p. 9.1 |
9.2 Ceramic Substrates for Microelectronic Applications | p. 9.2 |
9.3 Composite Materials | p. 9.9 |
9.4 Thick Film Technology | p. 9.11 |
9.5 Cermet Thick Film Conductor Materials | p. 9.18 |
9.6 Thick Film Resistor Materials | p. 9.20 |
9.7 Thick Film Dielectric Materials | p. 9.28 |
9.8 Overglaze Materials | p. 9.29 |
9.9 Conclusions | p. 9.30 |
9.10 Thin Film Technology | p. 9.30 |
9.11 Thin Film Materials | p. 9.35 |
9.12 Comparison of Thick and Thin Film | p. 9.37 |
9.13 Copper Metallization Technologies | p. 9.37 |
9.14 Summary of Substrate Metallization Technologies | p. 9.46 |
9.15 Resistor Trimming | p. 9.46 |
9.16 Assembly of Hybrid Circuits | p. 9.51 |
9.17 Packaging | p. 9.62 |
9.18 Design of Hybrid Circuits | p. 9.68 |
9.19 Multichip Modules | p. 9.71 |
References | p. 9.75 |
Chapter 10. Chip Scale Packaging and Direct Chip Attach Technologies | |
10.1 Introduction | p. 10.1 |
10.2 Background and History | p. 10.2 |
10.3 Electronic Interconnection Regime | p. 10.5 |
10.4 Early Minimalist IC Packaging Solution | p. 10.6 |
10.5 Current Interconnection Trends | p. 10.7 |
10.6 Important Shared Issues | p. 10.7 |
10.7 Markets for CSP and DCA | p. 10.15 |
10.8 Direct Chip Attach Technologies | p. 10.19 |
10.9 Chip scale Packages | p. 10.26 |
10.10 Testing CSPs and Direct Attach Assemblies | p. 10.48 |
10.11 Summary | p. 10.58 |
References | p. 10.58 |
Chapter 11. Rigid and Flexible Printed Wiring Boards and Microvia Technology | |
11.1 Introduction | p. 11.1 |
11.2 Printed Circuit Board System Types | p. 11.2 |
11.3 Printed Circuit Board Materials | p. 11.6 |
11.4 Design Considerations | p. 11.19 |
11.5 Manufacturing Considerations | p. 11.54 |
11.6 Microvias | p. 11.65 |
11.7 Industry Standards | p. 11.84 |
Suggested Reading | p. 11.86 |
Acknowledgment | p. 11.88 |
Part 3 System Packaging Technologies | |
Chapter 12. Packaging of High-Speed and Microwave Electronic Systems | |
12.1 Introduction | p. 12.1 |
12.2 Types of Circuit Media for Modern Microwave Packaging | p. 12.4 |
12.3 Limitations of Microwave Integrated Circuits | p. 12.9 |
12.4 Technology of Microwave Integrated Circuits | p. 12.13 |
12.5 Planar Waveguides | p. 12.21 |
12.6 Lumped-Element Circuits for Microwave Packages | p. 12.29 |
12.7 High-Speed Digital Packaging | p. 12.34 |
12.8 Electrical Design Inputs | p. 12.37 |
12.9 Netlist Analysis | p. 12.40 |
12.10 Design Restrictions | p. 12.42 |
12.11 PWB Layout Considerations | p. 12.52 |
12.12 Preferred Redesign Options | p. 12.54 |
12.13 CAD Interface | p. 12.57 |
References | p. 12.59 |
Chapter 13. Packaging of High-Voltage Systems | |
13.1 Introduction | p. 13.1 |
13.2 Properties of Insulating Materials | p. 13.1 |
13.3 Field Stress and Configurations | p. 13.21 |
13.4 Aerospace Design Considerations | p. 13.29 |
13.5 Design and Manufacturing Guidelines | p. 13.37 |
13.6 Tests | p. 13.48 |
13.7 Problems and Suggested Solutions | p. 13.53 |
13.8 Conclusions | p. 13.54 |
References | p. 13.55 |
Chapter 14. Electrical Characterization and Modeling of IC Packaging | |
14.1 Introduction | p. 14.1 |
14.2 Package Electrical Analysis | p. 14.2 |
14.3 Package Modeling | p. 14.23 |
14.4 Package Modeling Program | p. 14.34 |
14.5 Verification Method for Modeling Programs | p. 14.41 |
14.6 Summary | p. 14.52 |
References | p. 14.53 |
Appendix Electronic Packaging Terms and Abbreviations | p. 1 |
Index | p. 1 |
About the Editor | p. 1 |