Title:
VLSI test principles and architectures : design for testability
Series:
The Morgan Kaufmann series in systems on silicon
Publication Information:
Amsterdam : Morgan Kaufmann, 2006
Physical Description:
xxx, 777 p. : ill. ; 25 cm.
ISBN:
9780123705976
Available:*
Library | Item Barcode | Call Number | Material Type | Item Category 1 | Status |
---|---|---|---|---|---|
Searching... | 30000010178270 | TK7874.75 V47 2006 | Open Access Book | Book | Searching... |