Derivation of creepage distance in terms of ESDD and diameter of the contaminated insulator

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Publication Information:

Skudai: Universiti Teknologi Malaysia, 2000

General Note:

IEEE Power Engineering Review., Sept. 2000

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Library	Item Barcode	Call Number	Material Type	Item Category 1	Status
Searching... Perpustakaan Raja Zarith Sofiah	30000010055330	TK3401 M33 2000	Closed Access Book	1:BOOK_ARC	Searching... Unknown
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