Title:
IEEE transactions on reliability.
Publication Information:
New York : IEEE, 1963-
General Note:
On microfilm : Mikrofilem 20 : vol.12, no.1 (March 1963) - vol. 25, no.5 (Dec. 1976)
Continues : IRE transactions on reliability and quality control
Also available in online version. Full text: from vol. 37 issue 1 (1988) to present
Added Corporate Author:
Electronic Access:
Online access via IEEEXplore
Local Note:
Library has : vol.12, no.1 (March 1963)
DSP_RESTRICTION_NOTE:
Open access to UTM community only
Available:*
Library | Item Barcode | Call Number | Material Type | Item Category 1 | Status |
|---|---|---|---|---|---|
Searching... | 30000010017043 | TS173.I33 ol.40:no.1-5(1991) | Bound Journal | Bound Journal | Searching... |
Searching... | 30000010024769 | TS173.I33 ol.40:no.7-12(1992) | Bound Journal | Bound Journal | Searching... |
Searching... | 30000010024796 | TS173.I33 ol.41:no.1-4(1992) | Bound Journal | Bound Journal | Searching... |
Searching... | 30000000781025 | TS173.I33 j24, no 2 1975 | Bound Journal | Bound Journal | Searching... |
Searching... | 30000000780977 | TS173.I33 j26-27, 1977-78 | Bound Journal | Bound Journal | Searching... |
Searching... | 30000000781033 | TS173.I33 j28-29, 1979-1980 | Bound Journal | Bound Journal | Searching... |
Searching... | 30000000779078 | TS173.I33 j30, no 1-5 1981 | Bound Journal | Bound Journal | Searching... |
Searching... | 30000000779037 | TS173.I33 j31, no 1-4 1982 | Bound Journal | Bound Journal | Searching... |
Searching... | 30000000781074 | TS173.I33 j32, no 1-5 1983 | Bound Journal | Bound Journal | Searching... |
Searching... | 30000000781058 | TS173.I33 j33, no 1-5 1984 | Bound Journal | Bound Journal | Searching... |
Searching... | 30000000781017 | TS173.I33 j34, no 1-4 1985 | Bound Journal | Bound Journal | Searching... |
Searching... | 30000000781066 | TS173.I33 j35, no 1-5 1986 | Bound Journal | Bound Journal | Searching... |
Searching... | 30000002026668 | TS173.I33 j37, no1-5 1988 | Bound Journal | Bound Journal | Searching... |
