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Cover image for Physical and chemical characterization of oxide/germanium interfaces in ge mosfet
Title:
Physical and chemical characterization of oxide/germanium interfaces in ge mosfet
Personal Author:
Publication Information:
2015
Physical Description:
xi, 60 p. : ill. (some col.) ; 30 cm.
General Note:
Also available in CD-ROM : CP 059850 ra

Supervisor : Prof. Dr. Satoru Matsumoto
Added Author:
DSP_DISSERTATION:
Project Paper (Sarjana Muda Kejuruteraan Sistem Elektronik) - Universiti Teknologi Malaysia, 2015

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35000000021116 TK7871.95 N877 2015 raf Closed Access Thesis UTM Project Paper (Closed Access)
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