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Cover image for Built-in self test for phase-locked loop
Title:
Built-in self test for phase-locked loop
Personal Author:
Publication Information:
Skudai : Universiti Teknologi Malaysia, 2008
Physical Description:
xi, 36 p. : ill. ; 30 cm.
General Note:
Also available in CD-ROM : CP 015127 ra

Supervisor : Dr. Ooi Chia Yee
Subject Term:
Added Author:
DSP_DISSERTATION:
Thesis (Sarjana Kejuruteraan (Komputer dan Sistem Mikroelektronik)) - Universiti Teknologi Malaysia, 2008

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FKE30000002742 TK7872.P38 G63 2008 Closed Access Thesis UTM Master Thesis (Closed Access)
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30000010140176 TK7872.P38 G63 2008 Closed Access Thesis UTM Master Thesis (Closed Access)
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