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Cover image for Built-in self test for phase-locked loop
Title:
Built-in self test for phase-locked loop
Personal Author:
Publication Information:
Skudai : Universiti Teknologi Malaysia, 2008
Physical Description:
1 CD-ROM ; 12 cm.
General Note:
Also available in printed version : TK7872.P38 G63 2008 raf

Supervisor : Dr. Ooi Chia Yee
Subject Term:
Added Author:
DSP_DISSERTATION:
Thesis (Sarjana Kejuruteraan (Komputer dan Sistem Mikroelektronik)) - Universiti Teknologi Malaysia, 2008

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FKE30000005790 CP 015127 UTM Special Collection - Computer File Compact Disc Accompanies UTM Thesis/Project Paper
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30000010140175 CP 015127 UTM Special Collection - Computer File Compact Disc Accompanies UTM Thesis/Project Paper
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