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Summary
Summary
This text focuses on the practical aspects of crystal structure analysis, and provides the necessary conceptual framework for understanding and applying the technique. By choosing an approach that avoids undue emphasis on the mathematics involved, the book gives practical advice on topics such as growing crystals, solving and refining structures, and understanding and using the results. The technique described is a core experimental method in modern structural chemistry, and plays an ever more important role in the careers of final-year undergraduates, graduate students, postdoctoral and academic staff in chemistry.
Author Notes
Alexander J. Blake is at the School of Chemistry, The University of Nottingham. Robert O. Gould is in the Structural Biochemistry Unit, University of Edinburgh. Peter Main is in the Department of Physics, University of York. William Clegg is in the Department of Chemistry, University of Newcastle.
Table of Contents
1 A basic introduction to X-ray crystallography | p. 1 |
1.1 X-ray scattering from electrons | p. 1 |
1.2 X-ray scattering from atoms | p. 1 |
1.3 X-ray scattering from the contents of a unit cell | p. 3 |
1.4 The effects of the crystal lattice | p. 3 |
1.5 X-ray scattering from the crystal | p. 4 |
1.6 The structure factor equation | p. 4 |
1.7 The electron density equation | p. 5 |
1.8 A mathematical relationship | p. 6 |
1.9 Bragg's law | p. 6 |
1.10 Resolution | p. 7 |
1.11 The phase problem | p. 8 |
1.12 A flowchart for crystal structure determination | p. 9 |
2 Crystal growth, evaluation and mounting | p. 10 |
2.1 Crystal growth | p. 10 |
2.2 Survey of methods | p. 10 |
2.2.1 Solution methods | p. 10 |
2.2.2 Sublimation | p. 15 |
2.2.3 Fluid phase growth | p. 15 |
2.2.4 Solid-state synthesis | p. 16 |
2.2.5 General comments | p. 16 |
2.3 Sample evaluation | p. 17 |
2.3.1 Microscopy | p. 17 |
2.3.2 X-ray photography | p. 18 |
2.3.3 Diffractometry | p. 18 |
2.4 Crystal mounting | p. 18 |
2.4.1 Standard procedures | p. 18 |
2.4.2 Air-sensitive crystals | p. 20 |
References | p. 21 |
Some references on crystal growth and handling | p. 21 |
Exercises | p. 22 |
3 Symmetry and space group determination | p. 24 |
3.1 Introduction | p. 24 |
3.2 Basic operations and point groups | p. 25 |
3.3 External morphology | p. 26 |
3.4 Diffraction symmetry and the amount of independent data | p. 29 |
3.5 Internal symmetry and translational symmetry operations | p. 29 |
3.6 Detection of symmetry elements from intensity statistics | p. 32 |
3.7 Further notes on space group symbols | p. 34 |
3.8 Symmetry restrictions on atoms in special positions | p. 37 |
Exercises | p. 38 |
4 Background theory for data collection | p. 42 |
4.1 Introduction | p. 42 |
4.2 The geometry of X-ray diffraction | p. 42 |
4.3 The reciprocal lattice | p. 44 |
4.4 Unit cell and orientation matrix on a diffractometer | p. 45 |
4.5 Obtaining a matrix and cell from initially found reflections | p. 47 |
4.6 Symmetry aspects of the diffraction pattern | p. 48 |
References | p. 49 |
Exercises | p. 49 |
5 Data collection using four-circle diffractometers | p. 51 |
5.1 Introduction | p. 51 |
5.2 Experimental conditions | p. 51 |
5.2.1 Radiation | p. 51 |
5.2.2 Temperature | p. 52 |
5.2.3 Other conditions | p. 52 |
5.3 Getting started | p. 53 |
5.3.1 Reflection searching | p. 53 |
5.3.2 Indexing, orientation matrix and cell determination | p. 55 |
5.3.3 Finding the correct cell | p. 56 |
5.3.4 Obtaining a good orientation matrix | p. 57 |
5.3.5 Obtaining the best unit cell dimensions | p. 58 |
5.4 Preparing for data collection | p. 58 |
5.4.1 Introduction | p. 58 |
5.4.2 Parameters | p. 59 |
5.5 Data collection | p. 62 |
5.6 Gross systematic errors | p. 63 |
5.7 Correction of intensity data | p. 63 |
5.7.1 Absorption corrections | p. 63 |
5.7.2 Decay corrections | p. 65 |
5.7.3 Other possible corrections | p. 65 |
Exercises | p. 66 |
6 Area detectors | p. 69 |
6.1 Introduction | p. 69 |
6.2 Types of area detectors | p. 69 |
6.3 Some characteristics of CCD area detector systems | p. 72 |
6.4 A typical experiment | p. 74 |
6.4.1 Crystal screening | p. 74 |
6.4.2 Unit cell and orientation matrix determination | p. 74 |
6.4.3 Data collection | p. 76 |
6.4.4 Data reduction and corrections | p. 76 |
7 Fourier syntheses | p. 77 |
7.1 Fourier synthesis in 1D | p. 77 |
7.2 A 1D example--iron pyrites | p. 78 |
7.3 The 2D synthesis | p. 80 |
7.4 The 3D synthesis | p. 84 |
7.5 Uses of Fouriers | p. 84 |
7.6 Weighted Fouriers | p. 85 |
Exercises | p. 87 |
8 Structure determination by Patterson methods | p. 90 |
8.1 The heavy atom method | p. 93 |
8.2 Patterson search techniques | p. 96 |
8.2.1 Rotation search | p. 97 |
8.2.2 Translation search | p. 97 |
Exercises | p. 100 |
9 Direct methods of crystal structure determination | p. 102 |
9.1 Amplitudes and phases | p. 102 |
9.2 The physical basis of direct methods | p. 103 |
9.3 Constraints on the electron density | p. 103 |
9.3.1 Discrete atoms | p. 104 |
9.3.2 Non-negative electron density | p. 104 |
9.3.3 Random atomic distribution | p. 106 |
9.3.4 Maximum value of [function of] [rho superscript 3] (x) dV | p. 107 |
9.3.5 Equal atoms | p. 108 |
9.3.6 Maximum entropy | p. 108 |
9.3.7 Equal molecules and [rho] (x) = constant | p. 109 |
9.4 Structure invariants | p. 109 |
9.5 Structure determination | p. 109 |
9.5.1 Calculation of E values | p. 110 |
9.5.2 Setting up phase relationships | p. 111 |
9.5.3 Finding reflections for phase determination | p. 111 |
9.5.4 Assignment of starting phases | p. 112 |
9.5.5 Phase determination and refinement | p. 112 |
9.5.6 Figures of merit | p. 113 |
9.5.7 Interpretation of maps | p. 114 |
9.5.8 Completion of the structure | p. 114 |
References | p. 114 |
Exercises | p. 114 |
General bibliography | p. 117 |
10 An introduction to maximum entropy | p. 119 |
10.1 Entropy | p. 119 |
10.2 Maximum entropy | p. 119 |
10.3 Calculations with incomplete data | p. 120 |
10.4 Forming images | p. 122 |
10.5 Entropy and probability | p. 122 |
10.6 Electron density maps | p. 123 |
11 Least-squares fitting of parameters | p. 125 |
11.1 Weighted mean | p. 125 |
11.2 Linear regression | p. 126 |
11.3 Variances and covariances | p. 127 |
11.4 Restraints | p. 128 |
11.5 Constraints | p. 129 |
11.6 Non-linear least squares | p. 131 |
11.7 Ill-conditioning | p. 133 |
11.8 Computing time | p. 134 |
Exercises | p. 134 |
12 Practical aspects of structure refinement | p. 135 |
12.1 Introduction | p. 135 |
12.2 Data | p. 136 |
12.3 Parameters | p. 138 |
12.4 Constraints | p. 140 |
12.5 Restraints | p. 141 |
12.6 Refinement procedures | p. 142 |
12.7 Disorder | p. 144 |
12.8 Twinning | p. 144 |
12.9 Absolute structure | p. 145 |
12.10 Other problems | p. 146 |
Exercises | p. 147 |
13 The derivation of results | p. 148 |
13.1 Introduction | p. 148 |
13.2 Statistical background | p. 149 |
13.2.1 Some basic mathematics and statistics | p. 149 |
13.2.2 Errors, precision and accuracy | p. 153 |
13.2.3 Estimated standard deviations/standard uncertainties in crystallographic results | p. 154 |
13.3 Analysis of the agreement between observed and calculated data | p. 156 |
13.3.1 Observed and calculated data | p. 157 |
13.3.2 Significance testing | p. 159 |
13.4 Geometry | p. 159 |
13.4.1 Bond lengths, bond angles and torsion angles | p. 160 |
13.4.2 Least-squares planes and dihedral angles | p. 162 |
13.4.3 Conformations of rings and other molecular features | p. 163 |
13.4.4 Hydrogen atoms and hydrogen bonding | p. 163 |
13.5 Thermal motion | p. 164 |
13.5.1 [beta], B and U parameters | p. 164 |
13.5.2 'The equivalent isotropic displacement parameter' | p. 165 |
13.5.3 Models of thermal motion and geometrical corrections: rigid body motion | p. 166 |
13.5.4 Temperature and atomic displacement parameters | p. 167 |
References | p. 167 |
Exercises | p. 167 |
14 The interpretation of results | p. 169 |
14.1 Introduction | p. 169 |
14.2 Averages, comparisons and differences | p. 169 |
14.2.1 Comparison of geometrical parameters | p. 169 |
14.2.2 Averaging geometrical parameters | p. 171 |
14.2.3 When is a set of atoms genuinely planar? | p. 172 |
14.2.4 Comparing different structures | p. 173 |
14.3 Interpretation of interatomic distances and bonds | p. 175 |
14.4 The effects of errors on structural results | p. 176 |
14.4.1 Systematic errors in the data | p. 177 |
14.4.2 Data thresholds and weighting | p. 178 |
14.4.3 Errors and limitations of the model | p. 178 |
14.5 Assessment of a structure determination | p. 181 |
References | p. 182 |
Exercises | p. 183 |
15 The presentation of results | p. 184 |
15.1 Introduction | p. 184 |
15.2 Graphics | p. 184 |
15.2.1 Graphics programs | p. 185 |
15.2.2 Underlying concepts | p. 185 |
15.2.3 Drawing styles | p. 187 |
15.3 Creating three-dimensional illusions | p. 192 |
15.4 The use of colour | p. 193 |
15.5 Textual information in drawings | p. 194 |
15.6 Some hints for effective drawings | p. 194 |
15.7 Tables of results | p. 196 |
15.8 The content of tables | p. 196 |
15.9 The format of tables | p. 198 |
15.10 Hints on presentation | p. 198 |
15.11 Archiving of results | p. 201 |
References | p. 202 |
Exercises | p. 203 |
16 The Crystallographic Information File | p. 205 |
16.1 Introduction | p. 205 |
16.2 Basics | p. 205 |
16.3 Uses of CIF | p. 207 |
16.4 Some properties of the CIF format | p. 207 |
16.5 Some practicalities | p. 209 |
16.5.1 Strings | p. 209 |
16.5.2 Text | p. 209 |
16.5.3 Checking the CIF | p. 210 |
References | p. 210 |
Exercises | p. 211 |
17 Crystallographic databases | p. 214 |
17.1 Available structural databases | p. 214 |
17.2 Contents of the Cambridge Structural Database | p. 215 |
17.3 Searching the CSD | p. 216 |
18 Other topics | p. 218 |
18.1 Twinning | p. 218 |
18.2 Anomalous dispersion | p. 220 |
18.3 Sources of X-rays | p. 223 |
References | p. 226 |
Appendix 1 Useful mathematics and formulae | p. 227 |
Appendix 2 A short crystallographic dictionary | p. 237 |
Appendix 3 Answers to exercises | p. 245 |
Index | p. 263 |