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Print
181. 
Cover image for Collection of simulated XRD powder patterns for zeolites
182. 
Cover image for X-ray metrology in semiconductor manufacturing
184. 
Cover image for Fringe 2005 : The 5th International Workshop on Automatic Processing of Finge Patterns
186. 
Cover image for Thin film analysis by x-ray scattering
187. 
Cover image for Coherent x-ray optics
188. 
Cover image for Asymptotic and Hybrid Methods in Electromagnetics
189. 
Cover image for Diffractive optics : design, fabrication, and test
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