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British Standards Institution
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Integrated circuits -- Testing
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37. 
Cover image for Defect-oriented testing for nano-metric CMOS VLSI circuits
38. 
Cover image for Hardware and software, verification and testing : Second International Haifa Verification Conference, HVC 2006, Haifa, Israel, October 23-26, 2006 : revised selected papers
39. 
Cover image for Digital integrated circuits : design-for-test using Simulink and Stateflow
40. 
Cover image for The core test wrapper handbook : rationale and application of IEEE Std 1500
41. 
Cover image for Wireless IC testing on FPGA platform
42. 
Cover image for VLSI test principles and architectures : design for testability
43. 
Cover image for Data mining and diagnosing IC fails
44. 
Cover image for Applied formal verification
45. 
Cover image for Fault diagnosis of analog integrated circuits
46. 
Cover image for Functional verification of programmable embedded architectures : a top-down approach
47. 
Cover image for Introduction to advanced system-on-chip test design and optimization
48. 
Cover image for An experimental approach to CDMA and interference mitigation : from system architecture to hardware testing through VLSI design
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