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Library | Item Barcode | Call Number | Material Type | Item Category 1 | Status |
|---|---|---|---|---|---|
Searching... | 30000010175414 | TA410 P47 2009 | Open Access Book | Book | Searching... |
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Summary
Summary
Materials characterization is an important area of fundamental and technological interest. Numerous experimental techniques for determining the physical and chemical properties of materials have developed over the years. The companion to Advances in Materials Characterization, this volume comprises of review articles written by experts. It provides an introduction and overview of individual characterization techniques as well as a demonstration of their application to selected problems. This collection of advanced techniques will be invaluable to postgraduates, researchers, and faculty in the field of metallurgy and materials science.
Author Notes
G Amarendra is a Senior Scientist at the Materials Science Division, Indira Gandhi Centre for Atomic Research, Kalpakkam, India. He is a specialist in materials characterization using positron annihilation techniques in the areas of defects, radiation damage, and semiconductor heterostructures.
Baldev Raj is a Distinguished Scientist and Director of the Indira Gandhi Centre for Atomic Research, Kalpakkam, India. He is a specialist in the areas of non-destructive techniques, materials characterization, materials development and processing. He has received many prestigious national, and international awards and recognition.
M H Manghnani is a Professor at the University of Hawaii, USA, and is an internationally known expert in the study of materials under high pressure and high temperature, development of superhard coatings, and materials characterization.
Table of Contents
| Introduction Introduction to Materials Characterization | p. 1 |
| Chapter 1 Raman Spectroscopic Characterization of Nanostructured Materials | p. 23 |
| Chapter 2 Polychromatic Microdiffraction Studies of Inhomogeneous Deformation | p. 55 |
| Chapter 3 Materials Characterization by Ion Beams | p. 77 |
| Chapter 4 Piezo-spectroscopic Methods for the Quantitative Assessment of Stress in Ceramics and Semiconductor Compounds | p. 126 |
| Chapter 5 High-pressure Synchrotron X-Ray Spectroscopy with Diamond Anvil Cells | p. 151 |
| Index | p. 179 |
