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Summary
Summary
Due to the spectacular growth of electronic systems and the steady demand for new services with increased functionality, the development of more efficient measurement techniques has become of paramount importance. This practical resource details the cutting-edge Modulated Scatterer Technique, which offers a low-invasive and rapid method for testing and maesuring systems and equipment used in a wide range of electronic engineering applications. Extensively refrenced with 125 illustrations and 100 equations.
Author Notes
Jean-Charles Bolomey received his Ph.D. at the University of Paris.
Dr. Bolomey is the director of the Service of Electromagnetism at SUPELEC and a professor at the University of Paris, where he received his Ph.D for a thesis on resonant scattering. He created the Technical Applications Society for Microwave Imagery (SATIMO).
050
Table of Contents
Foreword | p. xiii |
Preface | p. xv |
Acknowledgments | p. xxi |
Chapter 1 Introduction | |
1.1 Where Near-Field Measurements Are Useful | p. 1 |
1.1.1 Information Provided by Near-Field Maps | p. 1 |
1.1.2 Near-Field Diagnostics | p. 2 |
1.1.3 Measurements May Perturb the Near-Fields | p. 2 |
1.1.4 Modulated Scatterer Approach | p. 2 |
1.1.5 Basic Requirement | p. 3 |
1.1.6 Near-to-Far-Field Transformations | p. 3 |
1.1.7 Two Sets of Applications of Modulated Scatterers | p. 3 |
1.2 Near-Field Basics | p. 4 |
1.2.1 Some Definitions for Free-Space Radiation of Antennas | p. 4 |
1.2.2 Extension to Small Antennas and Circuits | p. 5 |
1.2.3 About the Near Field Within Inhomogeneous Structures | p. 6 |
1.2.4 Remark | p. 6 |
1.3 Various Kinds of Measurements | p. 7 |
1.3.1 Standard Circuit Measurements | p. 7 |
1.3.2 Standard Antenna Measurements | p. 7 |
1.3.3 Direct Near-Field Measurement | p. 8 |
1.3.4 Perturbation Techniques for Indirect Measurements | p. 9 |
1.3.5 Cavity Perturbation | p. 9 |
1.3.6 Perturbation Measurement of SAR in Phantoms | p. 10 |
1.3.7 Perturbation by a Scatterer | p. 10 |
1.3.8 Measurement of the Far-Field Pattern of an Antenna | p. 11 |
1.4 Modulated Scatterer Technique | p. 11 |
1.4.1 Spinning Dipole | p. 11 |
1.4.2 Electrically Modulated Scatterer | p. 11 |
1.4.3 Historical Landmarks | p. 12 |
1.4.4 Comparison of Direct and Indirect Measurements | p. 13 |
1.4.5 Tagging Systems and Transponders | p. 13 |
1.4.6 Biologically Modulated Scatterers | p. 15 |
1.5 About Computer Simulation And Measurement | p. 17 |
1.6 Field Maps | p. 18 |
1.6.1 Microstrip Directional Coupler | p. 18 |
1.6.2 Printed Patch Antenna | p. 20 |
1.6.3 Measurements of Large Antennas | p. 22 |
1.6.4 EMC | p. 24 |
1.6.5 Dosimetry | p. 25 |
1.6.6 Microwave Tomography | p. 27 |
References | p. 30 |
Chapter 2 Basic Scatterer Electromagnetics | |
2.1 Introduction | p. 35 |
2.1.1 Effects Produced by a Field on a Probe | p. 35 |
2.1.2 Probe Characteristics in the Receiving Mode | p. 36 |
2.1.3 Probe Characteristics in the Scattering Mode | p. 36 |
2.1.4 Bistatic Operation | p. 37 |
2.1.5 Monostatic Operation | p. 38 |
2.1.6 Definition of the Nominal Environment | p. 38 |
2.1.7 Radar Analogy | p. 39 |
2.1.8 Power Considerations | p. 40 |
2.1.9 Comparison of Monostatic and Bistatic Operations | p. 40 |
2.1.10 Practical Considerations | p. 40 |
2.2 Principle Of Modulated Scattering | p. 41 |
2.2.1 Modulated Scatterers | p. 41 |
2.2.2 Mechanically Modulated Scatterers | p. 42 |
2.2.3 Electrically Modulated Scatterers | p. 43 |
2.2.4 Optically Modulated Scatterers | p. 44 |
2.2.5 Light Beam on Photosensitive Material | p. 45 |
2.2.6 Comparison of the Modulation Schemes | p. 46 |
2.2.7 Properties of the MST | p. 46 |
2.3 Equivalent Multiport Representation | p. 47 |
2.3.1 Equivalent Linear Black Box | p. 47 |
2.3.2 "Good" and "Bad" Obstacles | p. 48 |
2.3.3 Matrix Formulations | p. 49 |
2.3.4 Impedance Matrix | p. 49 |
2.3.5 Admittance Matrix | p. 50 |
2.3.6 Relationships Between [Z] and [Y] Matrices | p. 50 |
2.4 Scattering Matrix Formulation | p. 51 |
2.4.1 Complex Normalized Waves | p. 51 |
2.4.2 Scattering Matrix of an N-Port Device | p. 52 |
2.4.3 Translation of the Reference Planes | p. 52 |
2.4.4 Relationships Between Matrices | p. 53 |
2.4.5 Remark | p. 54 |
2.4.6 Scattering Matrix for the Monostatic Setup (N = 2) | p. 54 |
2.4.7 Scattering Matrix for the Bistatic Setup (N = 3) | p. 56 |
2.4.8 Extension to Configurations for Which N ] 3 | p. 57 |
2.4.9 Remark About Matrix Formulations | p. 58 |
References | p. 59 |
Chapter 3 Modulated Scattering Probes | |
3.1 Probe Response In Various Situations | p. 61 |
3.1.1 Probe Response in the Receiving Mode | p. 61 |
3.1.2 Monostatic Reflection Factor | p. 63 |
3.1.3 Monostatic Impedance and Admittance Changes | p. 64 |
3.1.4 Reflection from a Matched Probe | p. 64 |
3.1.5 Reflection Factor in the Unmodulated Situation | p. 65 |
3.1.6 Reflection Factor with Mechanical Modulation | p. 65 |
3.1.7 Reflection Factor with Electrical Modulation | p. 65 |
3.1.8 Bistatic Transmission Factor | p. 67 |
3.1.9 Introduction of a Generalized Term | p. 68 |
3.2 Calculation Of The Probe Response | p. 68 |
3.2.1 Reciprocity Theorem | p. 68 |
3.2.2 Reciprocity Formulation | p. 71 |
3.2.3 Conjugate Matched Probe in the Monostatic Case | p. 73 |
3.2.4 Reflectionless Matched Probe in the Monostatic Case | p. 73 |
3.2.5 Modulated Probe in the Monostatic Case | p. 74 |
3.2.6 Modulated Probe in the Bistatic Case | p. 75 |
3.3 Free-Space Measurements | p. 76 |
3.3.1 Locally Plane Waves | p. 76 |
3.3.2 Absorption Cross Sections | p. 77 |
3.3.3 RCS for Monostatic Setups | p. 78 |
3.3.4 Active or Passive Transponder | p. 79 |
3.3.5 RCS for Bistatic Setups | p. 79 |
3.4 Probes Used For Near-Field Testing | p. 80 |
3.4.1 Main Kinds of Probes | p. 80 |
3.4.2 Small Probes | p. 81 |
3.4.3 Short Electric Dipoles | p. 81 |
3.4.4 Small Magnetic Loops | p. 84 |
3.4.5 Tuned Probes | p. 86 |
3.4.6 Small Reflecting Spheres | p. 87 |
References | p. 89 |
Chapter 4 Moving Probe Setups | |
4.1 Low Invasiveness | p. 91 |
4.1.1 Basic Probe Requirements | p. 91 |
4.1.2 Why a Monostatic Rather Than a Bistatic Configuration? | p. 92 |
4.1.3 Description of a Measurement Configuration | p. 92 |
4.1.4 Optical Modulation | p. 93 |
4.1.5 Low-Frequency Connections with Resistive Wires | p. 94 |
4.1.6 Coherent Detection | p. 94 |
4.1.7 Number of Measurement Points | p. 95 |
4.1.8 About the Measurement Time | p. 95 |
4.2 Probes For Field Measurements | p. 96 |
4.2.1 Probes for Direct Antenna Measurements | p. 96 |
4.2.2 Probes for EMC Measurements | p. 97 |
4.2.3 Probes for Dosimetry | p. 97 |
4.2.4 Components of Modulated Scatterer Probes | p. 98 |
4.2.5 Probe for the Transverse Electric Field | p. 98 |
4.2.6 Probe for the Normal Electric Field | p. 99 |
4.2.7 Probe for the Transverse Magnetic Field | p. 100 |
4.2.8 Optically Modulated Probes | p. 100 |
4.3 Receivers For MST Arrangements | p. 101 |
4.3.1 Homodyne Receiver | p. 101 |
4.3.2 Remark About the Homodyne Receiver's Design | p. 102 |
4.3.3 Mathematical Background | p. 102 |
4.3.4 Cancellation of Unmodulated Signals | p. 103 |
4.3.5 Selection of the Modulation Frequency | p. 104 |
4.3.6 Signal-to-Noise Ratio | p. 105 |
4.4 About Measurement Accuracy | p. 106 |
4.4.1 Spatial Resolution | p. 106 |
4.4.2 Spurious Signals | p. 108 |
4.4.3 Close Range Interaction | p. 108 |
4.4.4 Close Range Interaction with Dielectric | p. 110 |
4.4.5 Comparison with Simulations | p. 111 |
4.4.6 Dynamic Range | p. 112 |
4.4.7 Caution: High Accuracy Is Not Always Required! | p. 113 |
4.4.8 Scaled Models and the Similitude Theorem | p. 114 |
4.5 Field Measurements In Materials | p. 115 |
4.5.1 Impact of Probe Immersion on Measurement Sensitivity | p. 115 |
4.5.2 Total-Field Measurement with Modulated Probes | p. 116 |
4.5.3 Total-Field Measurement with Unmodulated Probes | p. 116 |
4.6 Optical Analogy With Near-Field Microscopy | p. 117 |
4.6.1 Scanning Near-Field Optical Microscopy | p. 117 |
4.6.2 Microwave Near-Field Microscopy | p. 118 |
References | p. 120 |
Chapter 5 Applications of Single Probes | |
5.1 Description Of Some MST Test Setups | p. 123 |
5.1.1 National Physical Laboratory | p. 123 |
5.1.2 Swiss Ecole Polytechnique Federale of Lausanne | p. 125 |
5.1.3 University of Michigan at Ann Arbor | p. 126 |
5.1.4 Other Laboratories | p. 127 |
5.2 Antenna Diagnostics | p. 128 |
5.2.1 Horn Antennas | p. 128 |
5.2.2 Microstrip Patch Antennas | p. 130 |
5.2.3 Patch Antennas with Parasitic Elements | p. 131 |
5.2.4 PIFA Dual Band Antennas | p. 132 |
5.2.5 Multifrequency Multiband Antennas | p. 132 |
5.2.6 Near-Field Diffraction by Two Slits | p. 133 |
5.3 Printed Transmission Lines And Circuits | p. 135 |
5.3.1 Wilkinson Power Dividers | p. 135 |
5.3.2 Branch Line Hybrid Couplers | p. 135 |
5.3.3 Rat Race Hybrid Rings | p. 136 |
5.3.4 Meander Transmission Lines | p. 136 |
5.3.5 Microstrip Filters with Holes in the Ground Plane | p. 138 |
5.3.6 MMICs | p. 141 |
5.3.7 Radiating Probe for Microstrip Integrated Amplifier | p. 141 |
5.3.8 Currents on a Whisker Mixer for Radiometry | p. 142 |
5.4 Guiding Structures | p. 144 |
5.4.1 Detection of Electric-Field Lines in a Liquid Microstrip | p. 144 |
5.4.2 Fields in a Rectangular Waveguide | p. 146 |
5.5 EMC | p. 147 |
5.6 Industrial Applications | p. 148 |
5.6.1 Microwave and RF Heating | p. 148 |
5.6.2 Industrial Microwave and RF Heating | p. 148 |
5.6.3 Modulated Scatterer Moisture Sensors | p. 149 |
5.6.4 Near-Field Measurement in High-Power Systems | p. 149 |
5.7 Medical Applications And Dosimetry | p. 152 |
5.7.1 Diathermy and Hyperthermia | p. 152 |
5.7.2 Portable Phones | p. 152 |
5.7.3 Measurement of the SAR | p. 153 |
5.7.4 Radiometric Measurements | p. 154 |
5.7.5 SAR Measurement of Portable Phones | p. 155 |
5.7.6 Hyperthermia Applicator and Probe Characterization | p. 157 |
References | p. 157 |
Chapter 6 Probe Arrays | |
6.1 Introduction | p. 161 |
6.1.1 Reduction of the Duration of Measurements | p. 161 |
6.1.2 Reduction of the Amount of Measured Data | p. 162 |
6.1.3 Speeding Up the Measurement Rate | p. 162 |
6.1.4 Measurement Strategies | p. 163 |
6.2 Specific Features Of Probe Arrays | p. 164 |
6.2.1 Choice of Architectures | p. 164 |
6.2.2 Preconceptions | p. 166 |
6.2.3 Probe Array Arrangements | p. 167 |
6.2.4 Spatial Sampling Requirements | p. 169 |
6.3 MST For Arrays | p. 170 |
6.3.1 Array Elements | p. 170 |
6.3.2 Sensitivity of Collector Arrangements | p. 171 |
6.3.3 Uniformity of Collector Arrangements | p. 173 |
6.3.4 Calibrating the Probe Array and Collector Arrangements | p. 176 |
6.3.5 Practical Bistatic Realizations | p. 178 |
6.3.6 Different Modulation Possibilities | p. 180 |
6.3.7 Direct Determination of the Far-Field Pattern | p. 181 |
6.3.8 Focusing at an Arbitrary Finite Distance | p. 183 |
References | p. 185 |
Chapter 7 Applications of Probe Arrays | |
7.1 Communications And Radar Antenna Testing | p. 187 |
7.1.1 Antenna Testing Background | p. 187 |
7.1.2 Near-Field Versus Direct Measurement Techniques | p. 189 |
7.1.3 Selecting the Proper Near-Field Setup | p. 189 |
7.1.4 Linear Probe Arrays | p. 191 |
7.1.5 Planar Probe Arrays | p. 195 |
7.1.6 Circular Probe Arrays | p. 197 |
7.1.7 Direct Probing of the Far-Field Pattern | p. 200 |
7.2 RCS Measurements | p. 202 |
7.2.1 About Radar Testing | p. 202 |
7.2.2 Practical Implementation | p. 203 |
7.3 EMC Testing | p. 205 |
7.3.1 About EMC Measurements | p. 205 |
7.3.2 Field Mapping | p. 206 |
7.3.3 Coupling Cross Section Determination | p. 208 |
7.3.4 EMC Diagnostics | p. 209 |
7.3.5 Spatial Resolution | p. 210 |
7.4 ISM Applications | p. 211 |
7.4.1 About ISM Testing | p. 211 |
7.4.2 On-line Control of Conveyed Products | p. 211 |
7.4.3 Modulated Probe Array Arrangements | p. 212 |
7.4.4 Selection of the Operating Frequency | p. 212 |
7.4.5 Comparison with Other Microwave Sensors | p. 214 |
7.4.6 Description of a 10-GHz Multipurpose Linear Sensor | p. 215 |
7.4.7 Description of a 5.8-GHz Sensor Using WLAN's Circuits | p. 218 |
7.4.8 Microwave Materials | p. 221 |
7.4.9 Detection of Buried Objects | p. 223 |
7.4.10 Biomedical Applications | p. 225 |
7.4.11 About Instrumentation | p. 225 |
7.4.12 Microwave Camera Operating at 2.45 GHz | p. 226 |
7.4.13 Results | p. 226 |
7.4.14 Other ISM Applications | p. 229 |
References | p. 232 |
Chapter 8 Conclusion | |
8.1 Summing Up | p. 237 |
8.1.1 Local Field Measurements | p. 237 |
8.1.2 Wireless Data Collection | p. 238 |
8.1.3 Not Really a New Technique | p. 238 |
8.2 A Very Wide Range Of Applications | p. 239 |
8.2.1 Simple Inexpensive Test Setups | p. 239 |
8.2.2 Standard Grade Measurements | p. 239 |
8.2.3 More Specialized Applications | p. 240 |
8.2.4 Measurements Versus Simulations | p. 240 |
8.3 Future Developments | p. 241 |
List of Symbols | p. 243 |
About the Authors | p. 247 |
Index | p. 249 |