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Cover image for LSI/VLSI testability design
Title:
LSI/VLSI testability design
Personal Author:
Tsui, Frank F.
Publication Information:
New York : McGraw-Hill, 1986
ISBN:
9780070653412
Subject Term:
Integrated circuits -- Large scale integration -- Testing

Integrated circuits -- Very large scale integration -- Testing

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Library
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Material Type
Item Category 1
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 30000000992580 TK7874.T78 1986 Open Access Book Book
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