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Cover image for Essentials of electronic  testing for digital, memory and mixed - signal VLSI circuits
Title:
Essentials of electronic testing for digital, memory and mixed - signal VLSI circuits
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Publication Information:
Boston : Kluwer Acad. Publishers , 2000
ISBN:
9780792379911
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30000004877878 TK7874.75 B87 2000 Open Access Book Book
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Summary

Summary

The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have a research interest in this area. Apparently, most professors would not have taken a course on electronic testing when they were students. Other than the computer engineering curriculum being too crowded, the major reason cited for the absence of a course on electronic testing is the lack of a suitable textbook. For VLSI the foundation was provided by semiconductor device techn- ogy, circuit design, and electronic testing. In a computer engineering curriculum, therefore, it is necessary that foundations should be taught before applications. The field of VLSI has expanded to systems-on-a-chip, which include digital, memory, and mixed-signalsubsystems. To our knowledge this is the first textbook to cover all three types of electronic circuits. We have written this textbook for an undergraduate "foundations" course on electronic testing. Obviously, it is too voluminous for a one-semester course and a teacher will have to select from the topics. We did not restrict such freedom because the selection may depend upon the individual expertise and interests. Besides, there is merit in having a larger book that will retain its usefulness for the owner even after the completion of the course. With equal tenacity, we address the needs of three other groups of readers.


Table of Contents

Preface
About the Authors
I Introduction to Testing
1 Introduction
2 VLSI Testing Process and Test Equipment
3 Test Economics and Product Quality
4 Fault Modeling
II Test Methods
5 Logic and Fault Simulation
6 Testability Measures
7 Combinational Circuit Test Generation
8 Sequential Circuit Test Generation
9 Memory Test
10 DSP-Based Analog and Mixed-Signal Test
11 Model-Based Analog and Mixed-Signal Test
12 Delay Test
13 IDDQ Test
III Design for Testability
14 Digital DFT and Scan Design
15 Built-In Self-Test
16 Boundary Scan Standard
17 Analog Test Bus Standard
18 System Test and Core-Based Design
19 The Future of Testing
A Cyclic Redundancy Code Theory
B Primitive Polynomials of Degree 1 to 100
C Books on Testing
Bibliography
Index
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