Title:
Test vectors reduction for integrated circuit testing using horizontal hamming distance
Personal Author:
Physical Description:
xiii, 48 pages : illustrations (some colors) ; 30 cm
General Note:
Also available in CD-ROM : CP 059145 ra
Supervisor : Prof. Dr. Abu Khari A'ain
Added Author:
Added Corporate Author:
DSP_DISSERTATION:
Thesis (Sarjana Kejuruteraan (Elektrik - Komputer dan Sistem Mikroelektronik)) - Universiti Teknologi Malaysia, 2016
Available:*
Library | Item Barcode | Call Number | Material Type | Item Category 1 | Status |
|---|---|---|---|---|---|
Searching... | 32030000000823 | XX(856532.1) | Closed Access Thesis | UTM Master Thesis (Open Shelves) | Searching... |
Searching... | 35000000011910 | XX(856532.1) | Closed Access Thesis | UTM Master Thesis (Closed Access) | Searching... |
