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Cover image for Fault modeling of chirality variation for carbon nanotube field effect transistor and its effect on circuits performance
Title:
Fault modeling of chirality variation for carbon nanotube field effect transistor and its effect on circuits performance
Publication Information:
2015
Physical Description:
xiv, 67 p. : ill. (some col.) ; 30 cm.
General Note:
Also available in CD-ROM : CP 054504 ra

Supervisor : Prof. Dr. Abu Khari A'ain
Added Author:
Added Corporate Author:
DSP_DISSERTATION:
Thesis (Sarjana Kejuruteraan (Elektrik - Komputer dan Sistem Mikroelektronik)) - Universiti Teknologi Malaysia, 2015

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32030000000212 XX(850918.2) Closed Access Thesis UTM Master Thesis (Closed Access)
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35000000021476 TK7871.95 M64 2015 raf Closed Access Thesis UTM Master Thesis (Closed Access)
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