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Library | Item Barcode | Call Number | Material Type | Item Category 1 | Status |
|---|---|---|---|---|---|
Searching... | 30000000511588 | TK7868.D5 C66 1987 | Open Access Book | Book | Searching... |
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Summary
Summary
Test engineering has emerged as a crucial sub-profession of electrical engineering. This volume enables the practicing engineer or advanced student to acquire the knowledge to select a test strategy to match the product and the tools to carry out the strategy in accordance with performance requirements. Containing information not readily gained except through hard experience, this book covers the sequence of events encountered in most digital test development efforts where the test subjects are circuit boards or integrated circuits. Chapters provide general background on the subject; explore the alternatives for deriving a test program (stimulus generation, expected response generation, and circuit and fault modeling); and cover options in applying the test to the product, including automatic test equipment, device-under-test interface, ATE languages, aids to diagnostics, and troubleshooting. The closing chapter gives a managerial perspective for the engineer who expects to exercise the full range test responsibilities.
Reviews 1
Choice Review
Cortner's book is on test engineering as applied to digital electronic devices, circuits, and systems. Its broad coverage includes faults and failure mechanisms; fault modeling; test stimuli and responses; automatic test equipment (ATE), hardware, and languages; diagnostic techniques; design for testability (DFT). The presentation is at the level of a practicing engineer or possibly at that of a recent graduate. There are few (if any) university courses in test engineering, but this book could become the basis for one. Fundamental principles are stressed rather than the details of currently available equipment. Numerous references to the periodical literature are provided.-G. Weiss, Cooper Union
Table of Contents
| Faults and Failure Mechanisms |
| Digital Testing Overview |
| Stimulus Generation |
| Expected Response Determination |
| Circuit and Fault Modeling |
| Automatic Test Equipment |
| Device-Under-Test Interface |
| ATE Languages |
| Diagnostics and Troubleshooting Aids |
| Memory Testing |
| Design for Testability |
| Test Planning |
| Glossary |
| Index |
