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Cover image for Wakefield of a charged particulate influenced by emission process of secondary electrons
Title:
Wakefield of a charged particulate influenced by emission process of secondary electrons
Personal Author:
Series:
Research report/NIFS series (National Institute for Fusion Science (Japan)) ; 625
Publication Information:
Nagoya, Japan : NIFS, 2000

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30000004225920 QC770 R37 2000 f j625 Open Access Book Book
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30000004225961 QC770 R37 2000 f j625 Open Access Book Book
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