Thermomigration : an experimental damage mechanics study on nanoelectronic lead-free solder alloys

Title:

Personal Author:

Publication Information:

New York : University of New York at Buffalo, 2008

Physical Description:

xix, 189 p. : ill. ; 30 cm.

Subject Term:

DSP_DISSERTATION:

Thesis (Doktor Falsafah) - University of New York at Buffalo, 2008

Library	Item Barcode	Call Number	Material Type	Item Category 1	Status
Searching... Perpustakaan Raja Zarith Sofiah	30000010165926	TK7874.84 M46 2008	Closed Access Thesis	UTM PhD Thesis (Closed Access)	Searching... Unknown