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Cover image for Defect prediction model for testing phase
Title:
Defect prediction model for testing phase
Publication Information:
2009
Physical Description:
xiv, 60 p. : ill. ; 30 cm.
General Note:
Also available in CD-ROM : CP 017192 ra

Supervisor : Prof. Dr. Shamsul Sahibuddin
DSP_DISSERTATION:
Thesis (Sarjana Sains (Sains Komputer - Kejuruteraan Perisian Masa Nyata)) - Universiti Teknologi Malaysia, 2009

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30000010187376 QA274 Closed Access Thesis UTM Master Thesis (Closed Access)
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30000010241409 QA274 M83 2009 raf Closed Access Thesis UTM Master Thesis (Closed Access)
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