Reliability and materials issues of III-V and II-VI semiconductor optical and electrical devices and materials II : symposium held April 9-13, 2012, San Francisco, California, U.S.A.

Cover image for Reliability and materials issues of III-V and II-VI semiconductor optical and electrical devices and materials II : symposium held April 9-13, 2012, San Francisco, California, U.S.A.

Title:

Series:

Materials Research Society symposium proceedings ; v. 1432

Materials Research Society symposia proceedings ; v. 1432

Publication Information:

Warrendale, Pa. : Materials Research Society, c2012

Physical Description:

xiii, 195 p. : ill. ; 24 cm.

ISBN:

9781605114095

Subject Term:

Materials -- Reliability -- Congresses

Semiconductors -- Materials -- Congresses

Microelectronics -- Reliability -- Congresses

Added Author:

Ueda, Osamu

Added Corporate Author:

Materials Research Society. Meeting (2012 : San Francisco, Calif.)

Added Conference Author:

Symposium G, "Reliability and Materials Issues of II-VI and III-V Semiconductor Optical and Electron Devices and Materials II" (2012 : San Francisco, Calif.)

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Library	Item Barcode	Call Number	Material Type	Item Category 1	Status
Searching... PSZ JB	30000010312343	TK7871.85 R45 2012	Open Access Book	Book	Searching... Unknown

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On Order