Title:
High-speed circuit board signal integrity
Personal Author:
Series:
Artech House microwave library
Publication Information:
Boston, MA : Artech House, 2004
ISBN:
9781580531313
Available:*
Library | Item Barcode | Call Number | Material Type | Item Category 1 | Status |
---|---|---|---|---|---|
Searching... | 30000010077648 | TK7868.P7 T44 2004 | Open Access Book | Book | Searching... |
On Order
Summary
Summary
This engineering reference book covers the theoretical and practical aspects of high-speed digital signalling at the level of the printed circuit board.
Author Notes
Stephen C. Thierauf is presently chief scientist (technology) at SiSOFT
Table of Contents
Preface | p. xiii |
Chapter 1 Characteristics and Construction of Printed Wiring Boards | p. 1 |
1.1 Introduction | p. 1 |
1.2 Unit System | p. 1 |
1.3 PWB Construction | p. 2 |
1.3.1 Resins | p. 3 |
1.3.2 Alternate Resin Systems | p. 3 |
1.3.3 Reinforcements | p. 5 |
1.3.4 Variability in Building Stackups | p. 6 |
1.3.5 Mixing Laminate Types | p. 7 |
1.4 PWB Traces | p. 7 |
1.4.1 Copper Cladding | p. 8 |
1.4.2 Copper Weights and Thickness | p. 9 |
1.4.3 Plating the Surface Traces | p. 9 |
1.4.4 Trace Etch Shape Effects | p. 9 |
1.5 Vias | p. 10 |
1.5.1 Via Aspect Ratio | p. 13 |
1.6 Surface Finishes and Solder Mask | p. 14 |
1.7 Summary | p. 14 |
References | p. 15 |
Chapter 2 Resistance of Etched Conductors | p. 17 |
2.1 Introduction | p. 17 |
2.2 Resistance at Low Frequencies | p. 17 |
2.3 Loop Resistance and the Proximity Effect | p. 20 |
2.3.1 Resistance Matrix | p. 21 |
2.3.2 Proximity Effect | p. 22 |
2.4 Resistance Increase with Frequency: Skin Effect | p. 24 |
2.5 Hand Calculations of Frequency-Dependent Resistance | p. 27 |
2.5.1 Return Path Resistance | p. 28 |
2.5.2 Conductor Resistance | p. 28 |
2.5.3 Total Loop Resistance | p. 29 |
2.6 Resistance Increase Due to Surface Roughness | p. 29 |
2.7 Summary | p. 30 |
References | p. 30 |
Chapter 3 Capacitance of Etched Conductors | p. 31 |
3.1 Introduction | p. 31 |
3.2 Capacitance and Charge | p. 31 |
3.2.1 Dielectric Constant | p. 32 |
3.3 Parallel Plate Capacitor | p. 33 |
3.4 Self and Mutual Capacitance | p. 35 |
3.5 Capacitance Matrix | p. 37 |
3.6 Dielectric Losses | p. 39 |
3.6.1 Reactance and Displacement Current | p. 40 |
3.6.2 Loss Tangent | p. 40 |
3.6.3 Calculating Loss Tangent and Conductance G | p. 41 |
3.7 Environmental Effects on Laminate [epsilon subscript r] and Loss Tangent | p. 43 |
3.7.1 Temperature Effects | p. 44 |
3.7.2 Moisture Effects | p. 44 |
3.8 Summary | p. 45 |
References | p. 45 |
Chapter 4 Inductance of Etched Conductors | p. 47 |
4.1 Introduction | p. 47 |
4.2 Field Theory | p. 47 |
4.2.1 Permeability | p. 48 |
4.2.2 Inductance | p. 48 |
4.2.3 Internal and External Inductance | p. 49 |
4.2.4 Partial Inductance | p. 49 |
4.2.5 Reciprocity Principal and Transverse Electromagnetic Mode | p. 50 |
4.3 Circuit Behavior of Inductance | p. 51 |
4.3.1 Inductive Voltage Drop | p. 53 |
4.3.2 Inductive Reactance | p. 54 |
4.4 Inductance Matrix | p. 55 |
4.4.1 Using the Reciprocity Principle to Obtain the Inductance Matrix from a Capacitance Matrix | p. 55 |
4.5 Mutual Inductance | p. 55 |
4.5.1 Coupling Coefficient | p. 56 |
4.5.2 Beneficial Effects of Mutual Inductance | p. 57 |
4.5.3 Deleterious Effects of Mutual Inductance | p. 59 |
4.6 Hand Calculations for Inductance | p. 60 |
4.6.1 Inductance of a Wire Above a Return Plane | p. 60 |
4.6.2 Inductance of Side-by-Side Wires | p. 61 |
4.6.3 Inductance of Parallel Plates | p. 61 |
4.6.4 Inductance of Microstrip | p. 63 |
4.6.5 Inductance of Stripline | p. 63 |
4.7 Summary | p. 64 |
References | p. 65 |
Chapter 5 Transmission Lines | p. 67 |
5.1 Introduction | p. 67 |
5.2 General Circuit Model of a Lossy Transmission Line | p. 67 |
5.2.1 Relationship Between [omega]L and R | p. 70 |
5.2.2 Relationship Between [omega]C and G | p. 70 |
5.3 Impedance | p. 71 |
5.3.1 Calculating Impedance | p. 72 |
5.4 Traveling Waves | p. 73 |
5.4.1 Propagation Constant | p. 74 |
5.4.2 Phase Shift, Delay, and Wavelength | p. 75 |
5.4.3 Phase Constant at High Frequencies When R and G Are Small | p. 78 |
5.4.4 Attenuation | p. 79 |
5.4.5 Neper and Decibel Conversion | p. 80 |
5.5 Summary and Worked Examples | p. 82 |
References | p. 86 |
Chapter 6 Return Paths and Power Supply Decoupling | p. 87 |
6.1 Introduction | p. 87 |
6.2 Proper Return Paths | p. 87 |
6.2.1 Return Paths of Ground-Referenced Signals | p. 89 |
6.2.2 Stripline | p. 90 |
6.3 Stripline Routed Between Power and Ground Planes | p. 90 |
6.3.1 When Power Plane Voltage Is the Same as Signal Voltage | p. 90 |
6.3.2 When Power Plane Voltage Differs from Signal Voltage | p. 93 |
6.3.3 Power System Inductance | p. 94 |
6.4 Split Planes, Motes, and Layer Changes | p. 95 |
6.4.1 Motes | p. 95 |
6.4.2 Layer Changes | p. 98 |
6.5 Connectors and Dense Pin Fields | p. 98 |
6.5.1 Plane Perforation | p. 99 |
6.5.2 Antipads | p. 99 |
6.5.3 Nonfunctional Pads | p. 102 |
6.5.4 Guidelines for Routing Through Dense Pin Fields | p. 103 |
6.6 Power Supply Bypass/Decoupling Capacitance | p. 105 |
6.6.1 Power Supply Integrity | p. 106 |
6.6.2 Distributed Power Supply Interconnect Model | p. 110 |
6.7 Connecting to Decoupling Capacitors | p. 112 |
6.7.1 Via Inductance | p. 112 |
6.8 Summary | p. 114 |
References | p. 115 |
Chapter 7 Serial Communication, Loss, and Equalization | p. 117 |
7.1 Introduction | p. 117 |
7.2 Harmonic Contents of a Data Stream | p. 117 |
7.2.1 Line Spectra | p. 119 |
7.2.2 Combining Harmonics to Create a Pulse | p. 120 |
7.2.3 The Fourier Integral | p. 122 |
7.2.4 Rectangular Pulses with Nonzero Rise Times | p. 123 |
7.3 Line Codes | p. 125 |
7.4 Bit Rate and Data Rate | p. 126 |
7.5 Block Codes Used in Serial Transmission | p. 128 |
7.6 ISI | p. 130 |
7.6.1 Dispersion | p. 130 |
7.6.2 Lone 1-Bit Pattern | p. 131 |
7.7 Eye Diagrams | p. 132 |
7.8 Equalization and Preemphasis | p. 134 |
7.8.1 Preemphasis | p. 134 |
7.8.2 Passive Equalizers | p. 137 |
7.8.3 Passive RC Equalizer | p. 139 |
7.9 DC-Blocking Capacitors | p. 140 |
7.9.1 Calculating the Coupling Capacitor Value | p. 142 |
7.10 Summary | p. 145 |
References | p. 146 |
Chapter 8 Single-Ended and Differential Signaling and Crosstalk | p. 149 |
8.1 Introduction | p. 149 |
8.2 Odd and Even Modes | p. 149 |
8.2.1 Circuit Description of Odd and Even Modes | p. 150 |
8.2.2 Coupling Coefficient | p. 153 |
8.2.3 Stripline and Microstrip Odd- and Even-Mode Timing | p. 155 |
8.2.4 Effects of Spacing on Impedance | p. 157 |
8.3 Multiconductor Transmission Lines | p. 158 |
8.3.1 Bus Segmentation for Simulation Purposes | p. 159 |
8.3.2 Switching Behavior of a Wide Bus | p. 160 |
8.3.3 Simulation Results for Loosely Coupled Lines | p. 161 |
8.3.4 Simulation Results for Tightly Coupled Lines | p. 162 |
8.3.5 Data-Dependent Timing Jitter in Multiconductor Transmission Lines | p. 164 |
8.4 Differential Signaling, Termination, and Layout Rules | p. 165 |
8.4.1 Differential Signals and Noise Rejection | p. 165 |
8.4.2 Differential Impedance and Termination | p. 166 |
8.4.3 Reflection Coefficient and Return Loss | p. 170 |
8.4.4 PWB Layout Rules When Routing Differential Pairs | p. 172 |
8.5 Crosstalk | p. 173 |
8.5.1 Coupled-Line Circuit Model | p. 175 |
8.5.2 NEXT and FEXT Coupling Factors | p. 177 |
8.5.3 Using K[subscript b] to Predict NEXT | p. 178 |
8.5.4 Using K[subscript f] to Predict FEXT | p. 179 |
8.5.5 Guard Traces | p. 179 |
8.5.6 Crosstalk Worked Example | p. 180 |
8.5.7 Crosstalk Summary | p. 182 |
8.6 Summary | p. 182 |
References | p. 183 |
Chapter 9 Characteristics of Printed Wiring Stripline and Microstrips | p. 185 |
9.1 Introduction | p. 185 |
9.2 Stripline | p. 185 |
9.2.1 Time of Flight | p. 186 |
9.2.2 Impedance Relationship Between Trace Width, Thickness, and Plate Spacing | p. 187 |
9.2.3 Mask Biasing to Obtain a Specific Impedance | p. 189 |
9.2.4 Hand Calculation of Z[subscript o] | p. 189 |
9.2.5 Stripline Fabrication | p. 191 |
9.3 Microstrip | p. 193 |
9.3.1 Exposed Microstrip | p. 194 |
9.3.2 Solder Mask and Embedded Microstrip | p. 196 |
9.4 Losses in Stripline and Microstrip | p. 197 |
9.4.1 Dielectric Loss | p. 199 |
9.4.2 Conductor Loss | p. 199 |
9.5 Microstrip and Stripline Differential Pairs | p. 201 |
9.5.1 Broadside Coupled Stripline | p. 201 |
9.5.2 Edge-Coupled Stripline | p. 204 |
9.5.3 Edge-Coupled Microstrip | p. 205 |
9.6 Summary | p. 206 |
References | p. 207 |
Chapter 10 Surface Mount Capacitors | p. 209 |
10.1 Introduction | p. 209 |
10.2 Ceramic Surface Mount Capacitors | p. 209 |
10.2.1 Dielectric Temperature Characteristics Classification | p. 209 |
10.2.2 Body Size Coding | p. 211 |
10.2.3 Frequency Response | p. 212 |
10.2.4 Inductive Effects: ESL | p. 214 |
10.2.5 Dielectric and Conductor Losses: ESR | p. 215 |
10.2.6 Leakage Currents: Insulation Resistance | p. 218 |
10.2.7 Electrical Model | p. 219 |
10.2.8 MLCC Capacitor Aging | p. 220 |
10.2.9 Capacitance Change with DC Bias and Frequency | p. 221 |
10.2.10 MLCC Usage Guidelines | p. 222 |
10.3 SMT Tantalum Capacitors | p. 223 |
10.3.1 Body Size Coding | p. 223 |
10.3.2 Frequency Response | p. 224 |
10.3.3 Electrical Model | p. 225 |
10.3.4 Aging | p. 225 |
10.3.5 Effects of DC Bias, Temperature, and Relative Humidity | p. 225 |
10.3.6 Failure of Tantalum Capacitors | p. 226 |
10.3.7 ESR and Self Heating: Voltage and Temperature Derating | p. 227 |
10.3.8 Usage Guidelines | p. 227 |
10.4 Replacing Tantalum with High-Valued Ceramic Capacitors | p. 228 |
References | p. 230 |
Appendix Conversion Factors | p. 231 |
About the Author | p. 233 |
Index | p. 235 |