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IEEE Reliability Group
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Institute of Electrical and Electronics Engineers. Electron Divices Group
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Chakrabarty, Krishnendu
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Books
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Digital integrated circuits -- Testing
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Integrated circuits -- Testing
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Integrated circuits -- Very large scale integration -- Testing
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1. 
Cover image for Design, fabrication and testing of integrated circuits
2. 
Cover image for Testing for small-delay defects in nanoscale CMOS integrated circuits
3. 
Cover image for Wafer-level testing and test during burn-in for integrated circuits / Sudarshan Bahukudumbi, Krishnendu Chakrabarty
4. 
Cover image for Automatic testing and evaluation of digital integrated circuits
5. 
Cover image for The effects of backdriving digital integrated circuits during in-circuit testing
6. 
Cover image for Crystal growth and evaluation of silicon for VLSI and ULSI
7. 
Cover image for Digital system test and testable design : using HDL models and architectures
8. 
Cover image for Accelerating test, validation and debug of high speed serial interfaces
9. 
Cover image for An engineer's guide to automated testing of high-speed interfaces
10. 
Cover image for ESD : failure mechanisms and models
11. 
Cover image for Defects in microelectronic materials and devices
12. 
Cover image for Functional design errors in digital circuits : diagnosis correction and repair
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