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Cover image for Value analysis tear-down : a new process for product development and innovation

Value analysis tear-down : a new process for product development and innovation

by

Yoshihiko Sato

Author

Yoshihiko Sato, Kaufman, J. Jerry

Format:

Call Number

HD47.3 Y67 2005

Publisher

Industrial Press,

Publication Date

2005

ISBN

9780831132033

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2.

Cover image for Value engineering : analysis and methodology

Value engineering : analysis and methodology

by

Younker, Del L.

Author

Younker, Del L.

Format:

Call Number

TS168 Y68 2003

Publisher

Marcel Dekker,

Publication Date

2003

ISBN

9780824706968

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