Skip to:Content
|
Bottom
Cover image for Development of an auto variable temperature testing system for Intel microprocessor
Title:
Development of an auto variable temperature testing system for Intel microprocessor
Personal Author:
Publication Information:
Skudai : Universiti Teknologi Malaysia, 2006
DSP_DISSERTATION:
Project Paper (Sarjana Muda Kejuruteraan (Elektrik - Mekatronik)) - Universiti Teknologi Malaysia, 2006

Available:*

Library
Item Barcode
Call Number
Material Type
Item Category 1
Status
Searching...
FKE30000002095 TJ223.T4 W66 2006 Closed Access Thesis UTM Project Paper (Closed Access)
Searching...
Searching...
30000010071507 TJ223.T4 W66 2006 Closed Access Thesis UTM Project Paper (Closed Access)
Searching...

On Order

Go to:Top of Page