![Cover image for Characterization of gate-all-around heterostructure strained-silicon nanowire field-effect transistor Cover image for Characterization of gate-all-around heterostructure strained-silicon nanowire field-effect transistor](/client/assets/5.0.0/ctx//client/images/no_image.png)
Title:
Characterization of gate-all-around heterostructure strained-silicon nanowire field-effect transistor
Personal Author:
Physical Description:
xvii, 63 pages : illustrations (some colors) ; 30 cm
General Note:
Also available in CD-ROM : CP 080842 ra
Fulltext is available at http://dms.library.utm.my:8080
Supervisor : Prof. Dr. Razali Ismail
Added Author:
Added Corporate Author:
DSP_DISSERTATION:
Project Paper (Sarjana Muda Kejuruteraan (Elektrik - Elektronik)) - Universiti Teknologi Malaysia, 2018
Available:*
Library | Item Barcode | Call Number | Material Type | Item Category 1 | Status |
---|---|---|---|---|---|
Searching... | 32030000001861 | TK7871.9 L66 2018 raf | Closed Access Thesis | UTM Project Paper (Open Shelves) | Searching... |
Searching... | 35000000022629 | TK7871.9 L66 2018 raf | Closed Access Thesis | UTM Project Paper (Closed Access) | Searching... |