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Cover image for Characterization of gate-all-around heterostructure strained-silicon nanowire field-effect transistor
Title:
Characterization of gate-all-around heterostructure strained-silicon nanowire field-effect transistor
Physical Description:
xvii, 63 pages : illustrations (some colors) ; 30 cm
General Note:
Also available in CD-ROM : CP 080842 ra

Fulltext is available at http://dms.library.utm.my:8080

Supervisor : Prof. Dr. Razali Ismail
Added Author:
Added Corporate Author:
DSP_DISSERTATION:
Project Paper (Sarjana Muda Kejuruteraan (Elektrik - Elektronik)) - Universiti Teknologi Malaysia, 2018

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32030000001861 TK7871.9 L66 2018 raf Closed Access Thesis UTM Project Paper (Open Shelves)
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35000000022629 TK7871.9 L66 2018 raf Closed Access Thesis UTM Project Paper (Closed Access)
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