Title:
The effects of backdriving digital integrated circuits during in-circuit testing
Personal Author:
General Note:
International TEST Conference. 269-289 ; 1982
Available:*
Library | Item Barcode | Call Number | Material Type | Item Category 1 | Status |
|---|---|---|---|---|---|
Searching... | 30000001285067 | MAK 1998 | Open Access Book | Article | Searching... |
