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Cover image for Value analysis tear-down : a new process for product development and innovation
Title:
Value analysis tear-down : a new process for product development and innovation
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Publication Information:
New York : Industrial Press, 2005
ISBN:
9780831132033
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30000010071234 HD47.3 Y67 2005 Open Access Book Book
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Summary

Summary

This book presents, for the first time, a new technology for improving products and innovating new and better products, first developed in Japan by Yoshihiko Sato. Value analysis tear-down combines traditional tear-down with the technologies of value analysis and value engineering. Within a few years of its public announcement in Japan, value analysis tear-down was adopted by all eleven Japanese automobile manufacturers, and many of the Japanese consumer electronics manufacturers. Jerry Kaufman, based in Houston, Texas, is a recognized authority and author on value engineering and value management, and has contributed much that is in these technologies to the process described in this book. The result of his collaboration with Mr. Sato is a process that helps engineers and managers reduce product cost, improve quality, continuously improve existing products, and discover opportunities for innovative change.

The first "how-to-do-it" book in English, it is written specifically for professionals in product engineering, manufacturing engineering, and value engineering; and the managers of these professionals, including plant managers, production managers, manufacturing executives, and research and development executives. It will also be useful to manufacturing, marketing, and management people concerned with product improvement, innovation, and improving their company's competitive position. Value analysis tear-down can be applied in many service and other industries, as well as in manufacturing; wherever there are physical components to be improved or invented.


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