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Summary
Summary
This unique resource provides microwave remote sensing professionals with practical scattering and emission data models that represent the interaction between electromagnetic waves and a scene on the Earth surface in the microwave region. The book helps engineers understand and apply these models to their specific work in the field. CD-ROM Included It contains Mathematica code for all the scattering and emission models presented the book, so practitioners can easily use the models for their own applications.
Author Notes
Adrian K. Fung served as the director of the Wave scattering Research Center, was the Jenkins-Garrett Professor of electrical engineering, and was a member of Academy of Distinguished Scholars at the University of Texas at Arlington. He is also the author of Microwave Scattering and Emission Models and Their Applications (Artech House, 1994) and has coauthored and contributed to several microwave remote sensing books in the field. Dr. Fung received his Ph.D. from the University of Kansas.
K. S. Chen is the director of the Communications Research Center and holds the distinguished chair professorship at the National Central University in Chung-Li, Taiwan. He is an associate editor of the IEEE Transactions on Geoscience and Remote Sensing and serves as the deputy editor-in chief of the IEEE Journal of Selected Topics in Applied Earth Observations and Remote Sensing.
Table of Contents
Preface | p. xv |
Chapter 1 Introduction to Microwave Scattering and Emission Models for Users | p. 1 |
1.1 Introduction | p. 1 |
1.2 Organization | p. 3 |
1.3 Model Definitions for Active and Passive Sensing | p. 6 |
Chapter 2 The Small Perturbation Surface Backscattering Model | p. 9 |
2.1 Introduction | p. 9 |
2.1.1 Shadowing Considerations | p. 11 |
2.2 Isotropic Exponential Correlation with a Gaussian Height Distribution | p. 13 |
2.2.1 Theoretical Trends for the Exponential Correlation | p. 14 |
2.2.2 Comparison with Measurements | p. 18 |
2.3 Isotropic Gaussian Correlation with a Gaussian Height Distribution | p. 20 |
2.3.1 Theoretical Trends for the Gaussian Correlation | p. 20 |
2.3.2 Comparison with Measurements | p. 25 |
2.4 Isotropic x-Power Correlation with a Gaussian Height Distribution | p. 26 |
2.4.1 Theoretical Trends for the x-Power Correlation | p. 27 |
2.4.2 Comparison with Measurements | p. 33 |
2.5 Isotropic x-Exponential Correlation with a Gaussian Height Distribution | p. 34 |
2.5.1 Theoretical Trends for the x-Exponential Correlation | p. 35 |
2.5.2 Comparison with Measurements | p. 38 |
2.6 Isotropic Exponential-Like Correlation with a Gaussian Height Distribution | p. 40 |
2.6.1 Theoretical Trends for the Exponential-Like Correlation | p. 42 |
2.6.2 Comparison with Measurements | p. 43 |
2.7 Discussion | p. 44 |
References | p. 45 |
Chapter 3 The Simplified Integral Equation Surface Backscattering Model | p. 47 |
3.1 Introduction | p. 47 |
3.1.1 The Simplified IEM Model | p. 48 |
3.1.2 Computer Program Organization | p. 52 |
3.2 Isotropic Exponential Correlation | p. 53 |
3.2.1 Theoretical Trends in Like Polarized Scattering with Exponential Correlation | p. 54 |
3.2.2 Theoretical Trends in Cross-Polarized Scattering with Exponential Correlation | p. 60 |
3.2.3 Comparison with Measurements | p. 62 |
3.3 Isotropic Gaussian Correlation | p. 71 |
3.3.1 Theoretical Trends in Like Polarized Scattering with Gaussian Correlation | p. 71 |
3.3.2 Theoretical Trends in Cross-Polarized Scattering with Gaussian Correlation | p. 77 |
3.3.3 Comparison with Measurements and Simulations | p. 80 |
3.4 Isotropic x-Power Correlation | p. 92 |
3.4.1 Theoretical Trends in Like Polarized Scattering with x-Power Correlation | p. 92 |
3.4.2 Theoretical Trends in Cross-Polarized Scattering with x-Power Correlation | p. 101 |
3.4.3 Comparison with Measurements and Simulations | p. 104 |
3.5 Isotropic x-Exponential Correlation | p. 117 |
3.5.1 Theoretical Trends in Like Polarized Scattering with x-Exponential Correlation | p. 117 |
3.5.2 Comparison with Measurements | p. 128 |
3.6 Isotropic Exponential-Like Correlation | p. 132 |
3.6.1 A Comparison of Spectral Contents | p. 134 |
3.6.2 Theoretical Trends in Like Polarized Scattering with Exponential-Like Correlation | p. 136 |
3.6.3 Comparison with Measurements and Simulations | p. 144 |
3.7 Discussion | p. 158 |
References | p. 159 |
Chapter 4 The IEM-B Surface Backscattering Model | p. 161 |
4.1 Introduction | p. 161 |
4.2 Isotropic Exponential Correlation | p. 166 |
4.2.1 Theoretical Trends for Like Polarization with Exponential Correlation | p. 167 |
4.2.2 Comparison with Measurements | p. 175 |
4.3 Isotropic Gaussian Correlation | p. 181 |
4.3.1 Theoretical Trends for Like Polarization with Gaussian Correlation | p. 182 |
4.3.2 Comparison with Measurements and Simulations | p. 187 |
4.4 Isotropic x-Power Correlation | p. 200 |
4.4.1 Theoretical Trends for Like Polarization with x-Power Correlation | p. 201 |
4.4.2 Comparison with Measurements and Simulations | p. 209 |
4.5 Isotropic x-Exponential Correlation | p. 222 |
4.5.1 Theoretical Trends for x-Exponential Correlation | p. 222 |
4.5.2 Comparison with Measurements | p. 232 |
4.6 Isotropic Exponential-Like Correlation | p. 235 |
4.6.1 A Comparison of Spectral Contents | p. 238 |
4.6.2 Theoretical Trends for Exponential-Like Correlation | p. 240 |
4.6.3 Comparison with Measurements and Simulations | p. 248 |
4.7 Illustration of Surface Parameter Selection | p. 257 |
4.7.1 Shadowing Effect | p. 257 |
4.7.2 Effect of rms Height | p. 259 |
4.7.3 Effect of Correlation Length | p. 260 |
4.7.4 Effect of Dielectric Constant | p. 261 |
4.8 Discussion | p. 263 |
References | p. 264 |
Chapter 5 Backscattering from Multiscale Surfaces | p. 267 |
5.1 Introduction | p. 267 |
5.2 Backscattering from Multiscale Rough Surfaces | p. 268 |
5.2.1 Two-Scale Gaussian-Distributed, Gaussian-Correlated Random Surface | p. 269 |
5.2.2 Three-Scale Gaussian-Distributed, Gaussian-Correlated Random Surface | p. 276 |
5.2.3 Conclusions on Multiscale Surface | p. 282 |
5.3 Anisotropically Rough Surfaces | p. 283 |
5.3.1 Anisotropic Exponential Correlation | p. 283 |
5.3.2 Anisotropic Gaussian Correlation | p. 288 |
5.3.3 An Anisotropic p-Exponential Correlation | p. 294 |
5.4 Discussion | p. 296 |
References | p. 297 |
Chapter 6 Bistatic Properties of the IEM-B Surface Scattering Model | p. 299 |
6.1 Introduction | p. 299 |
6.2 The Bistatic Scattering Coefficients | p. 299 |
6.3 Theoretical Behaviors and Model Comparisons | p. 302 |
6.3.1 Theoretical Behaviors | p. 302 |
6.3.2 Comparisons with the Simplified IEM Model | p. 312 |
6.4 Comparisons with Bistatic Scattering from Known Surfaces | p. 320 |
6.4.1 Surface Slope Effects | p. 320 |
6.4.2 Coherent Contribution in Azimuthal Scattering | p. 325 |
6.4.3 High-Frequency Effects on Modeling | p. 326 |
6.4.4 Measurements at EMSL | p. 328 |
6.5 Discussion | p. 328 |
References | p. 330 |
Chapter 7 The Standard Moment Method | p. 331 |
7.1 Introduction | p. 331 |
7.2 Generation of Digital Surfaces | p. 331 |
7.2.1 Surface with an Analytic Correlation Function | p. 332 |
7.2.2 Surface with a Digital Correlation Function | p. 333 |
7.3 Two-Dimensional Surface Scattering Simulation | p. 334 |
7.3.1 Moment Method Formulation for Dielectric Surfaces | p. 334 |
7.4 Simulation Parameter Selection for Single-Scale Rough Surfaces | p. 343 |
7.4.1 Effective Window Width Relative to the Gaussian Window | p. 343 |
7.4.2 Points Per Wavelength or Correlation Length | p. 345 |
7.4.3 Patch Size | p. 345 |
7.5 Comparisons with Measurements from Known Rough Surfaces | p. 348 |
7.5.1 Conversion of a Two-Dimensional Simulation to Three Dimensions | p. 348 |
7.5.2 Comparisons with Measurements | p. 349 |
7.6 Discussion | p. 356 |
References | p. 357 |
Chapter 8 Model for Scattering from a Low-Dielectric Layer of Rayleigh Scatterers with Irregular Layer Boundaries | p. 359 |
8.1 Introduction | p. 359 |
8.2 Geometry of the Scattering Problem | p. 360 |
8.3 Rayleigh Layer Parameters | p. 362 |
8.4 Theoretical Studies | p. 363 |
8.4.1 Effects of the Albedo | p. 363 |
8.4.2 Effects of Optical Depth and Surface Scattering | p. 364 |
8.5 Comparison with Measurements | p. 367 |
8.5.1 Comparisons with Alfalfa | p. 367 |
8.5.2 Comparisons with Corn | p. 368 |
8.5.3 Comparisons with Soybeans | p. 370 |
8.5.4 Comparisons with Cypress | p. 372 |
8.5.5 Comparisons with Snow | p. 373 |
8.6 Discussion | p. 376 |
References | p. 376 |
Chapter 9 Emission Models for Rough Surfaces and a Rayleigh Layer with Irregular Layer Boundaries | p. 377 |
9.1 Introduction | p. 377 |
9.2 Rough Surface Emission | p. 378 |
9.3 Parameter Effects of the Surface Emission Model | p. 378 |
9.3.1 Effects of Surface Height Variations | p. 378 |
9.3.2 Effects of Different Correlation Lengths | p. 381 |
9.3.3 Effects of Surface Dielectric Constant | p. 382 |
9.3.4 Frequency Dependence | p. 383 |
9.4 Comparison with Measurements | p. 385 |
9.4.1 Emission from a Soil Surface | p. 385 |
9.4.2 Emission from Saline Ice | p. 385 |
9.5 Rayleigh Layer over a Rough Surface | p. 387 |
9.5.1 Parameter Effects of a Rayleigh Layer Model | p. 389 |
9.5.2 Comparisons with Measurements | p. 398 |
9.6 Emission from a Rayleigh Layer-Numerical Solution | p. 406 |
9.6.1 Solution of Radiative Transfer Equation | p. 408 |
9.6.2 Comparisons with Measurements | p. 411 |
9.7 Discussion | p. 423 |
References | p. 423 |
About the Authors | p. 425 |
Index | p. 427 |