Cover image for Random power supply as a test vector to expose soft defects in CMOS digital circuits
Title:
Random power supply as a test vector to expose soft defects in CMOS digital circuits
Personal Author:
Publication Information:
Skudai : Universiti Teknologi Malaysia, 2000
General Note:
Loan on microfilm form only : MFL 10337 ra
DSP_DISSERTATION:
Thesis (Master in Electrical Engineering) - Universiti Teknologi Malaysia, 2000

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FKE30000000951 TK1001 I92 2000 Closed Access Thesis UTM Master Thesis (Closed Access)
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30000010149037 TK1001 I92 2000 Closed Access Thesis UTM Master Thesis (Closed Access)
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30000004482109 TK1001 I92 2000 raf Closed Access Thesis UTM Master Thesis (Closed Access)
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