Cover image for Digital holography for MEMS and microsystem metrology
Title:
Digital holography for MEMS and microsystem metrology
Publication Information:
Chichester, West Sussex, U.K. ; Hoboken, N.J. : Wiley, 2011
Physical Description:
x, 205 p. : ill. ; 24 cm.
ISBN:
9780470978696
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30000010281285 TK7875 D54 2011 Open Access Book Book
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Summary

Summary

Approaching the topic of digital holography from the practical perspective of industrial inspection, Digital Holography for MEMS and Microsystem Metrology describes the process of digital holography and its growing applications for MEMS characterization, residual stress measurement, design and evaluation, and device testing and inspection. Asundi also provides a thorough theoretical grounding that enables the reader to understand basic concepts and thus identify areas where this technique can be adopted. This combination of both practical and theoretical approach will ensure the book's relevance and appeal to both researchers and engineers keen to evaluate the potential of digital holography for integration into their existing machines and processes. Addresses particle characterization where digital holography has proven capability for dynamic measurement of particles in 3D for sizing and shape characterization, with applications in microfluidics as well as crystallization and aerosol detection studies. Discusses digital reflection holography, digital transmission holography, digital in-line holography, and digital holographic tomography and applications. Covers other applications including micro-optical and diffractive optical systems and the testing of these components, and bio-imaging.


Author Notes

Anand Asundi, Nanyang Technological University, Singapore
Anand Asundi is Professor and Deputy Director of the Advanced Materials Research Centre at Nanyang Technological University in Singapore. His research interests are in photomechanics and optical sensors & he has published over 200 papers in peer-reviewed journals and presented invited and plenary talks at international conferences. He has also chaired and organized numerous conferences in Singapore and other parts of the world.
He is Editor of Optics and Lasers in Engineering and on the Board of Directors of SPIE, and a fellow of the Institute of Engineers, Singapore and SPIE. He also holds advisory professorial appointments at Tongji University, Shanghai University and Harbin Institute of Technology, China. He is Chairman of the Asian Committee on Experimental Mechanics and the Asia Pacific Committee on Smart and Nano Materials both of which he co-founded.


Table of Contents

Anand AsundiVijay R. Singh and Anand AsundiQu WeijuanTaslima KhanamCaojin Yuan and Hongchen ZhaiYu YingjieJianlin ZhaoAnand Asundi
About the Editorp. xi
Contributorsp. xiii
Series Prefacep. xvii
Acknowledgementsp. xix
Abbreviationsp. xxi
1 Introductionp. 1
2 Digital Reflection Holography and Applicationsp. 7
2.1 Introduction to Digital Holography and Methodsp. 7
2.1.1 Holography and Digital Holographyp. 7
2.1.2 Digital Recording Mechanismp. 9
2.1.3 Numerical Reconstruction Methodsp. 10
2.2 Reflection Digital Holographic Microscope (DHM) Systems Developmentp. 13
2.2.1 Optical Systems and Methodologyp. 13
2.3 3D Imaging, Static and Dynamic Measurementsp. 23
2.3.1 Numerical Phase and 3D Measurementsp. 23
2.3.2 Digital Holographic Interferometryp. 25
2.4 MEMS/Microsystems Characterization Applicationsp. 31
2.4.1 3D Measurementsp. 31
2.4.2 Static Measurements and Dynamic Interferometric Measurementp. 35
2.4.3 Vibration Analysisp. 39
Referencesp. 50
3 Digital Transmission Holography and Applicationsp. 51
3.1 Historical Introductionp. 51
3.2 The Foundation of Digital Holographyp. 53
3.2.1 Theoretical Analysis of Wavefront Interferencep. 58
3.2.2 Digital Hologram Recording and Reconstructionp. 70
3.2.3 Different Numerical Reconstruction Algorithmsp. 71
3.3 Digital Holographic Microscopy Systemp. 73
3.3.1 Digital Holographic Microscopy with Physical Spherical Phase Compensationp. 74
3.3.2 Lens-Less Common-Path Digital Holographic Microscopep. 79
3.3.3 Common-Path Digital Holographic Microscopep. 84
3.3.4 Digital Holographic Microscopy with Quasi-Physical Spherical Phase Compensation: Light with Long Coherence Lengthp. 92
3.3.5 Digital Holographic Microscopy with Quasi-Physical Spherical Phase Compensation: Light with Short Coherence Lengthp. 99
3.4 Conclusionp. 102
Referencesp. 104
4 Digital In-Line Holography and Applicationsp. 109
4.1 Backgroundp. 109
4.2 Digital In-Line Holographyp. 111
4.2.1 Recording and Reconstructionp. 111
4.3 Methodology for 2D Measurement of Micro-Particlesp. 114
4.3.1 Numerical Reconstruction, Pre-Processing and Background Correctionp. 114
4.3.2 Image Segmentationp. 116
4.3.3 Particle Focusingp. 117
4.3.4 Particle Size Measurementp. 118
4.4 Validation and Performance of the 2D Measurement Methodp. 120
4.4.1 Verification of the Focusing Algorithmp. 121
4.4.2 Spherical Beads on a Glass Slidep. 123
4.4.3 Microspheres in a Flowing Systemp. 124
4.4.4 10 ¿m Microspheres Suspensionp. 125
4.4.5 Measurements of Microfibersp. 125
4.5 Methodology for 3D Measurement of Micro-Fibersp. 128
4.5.1 Method 1: The 3D Point Cloud Methodp. 129
4.5.2 Method 2: The Superimposition Methodp. 130
4.6 Validation and Performance of the 3D Measurement Methodsp. 134
4.6.1 Experiment with a Single Fiberp. 134
4.6.2 3D Measurements of Micro-Fibers in Suspensionp. 135
4.7 Conclusionp. 136
Referencesp. 137
5 Other Applicationsp. 139
5.1 Recording Plane Division Multiplexing (RDM) in Digital Holography for Resolution Enhancementp. 141
5.1.1 Introduction of the Recording Plane Division Multiplexing Techniquep. 141
5.1.1.1 The SM Techniquep. 142
5.1.1.2 The ADM Techniquep. 143
5.1.1.3 The WDM Techniquep. 145
5.1.1.4 The PM Techniquep. 146
5.1.2 RDM Implemented in Pulsed Digital Holography for Ultra-Fast Recordingp. 147
5.1.2.1 Introductionp. 147
5.1.2.2 AMD in the Pulsed Digital Holographyp. 148
5.1.2.3 WDM in Pulsed Digital Holographyp. 150
5.1.3 RDM Implemented by Digital Holography for Spatial Resolution Enhancementp. 152
5.1.3.1 Introductionp. 152
5.1.3.2 AMD in Digital Holographyp. 153
5.1.3.3 AMD and PM in Digital Holographyp. 156
5.1.4 Conclusionp. 159
Referencesp. 160
5.2 Development of Digital Holographic Tomographyp. 161
5.2.1 Introductionp. 161
5.2.2 Classification of Digital Holographic Tomographyp. 162
5.2.3 Principle of Digital Holographic Tomographyp. 166
5.2.3.1 Principle of Digital Holographicp. 166
5.2.3.2 Reconstruction Principle of Computer Tomographyp. 166
5.2.3.3 CT Reconstruction Algorithmsp. 168
5.2.4 Application of DHTp. 170
5.2.4.1 Detection of Biological Tissuep. 170
5.2.4.2 Material Detectionp. 172
Referencesp. 175
5.3 Digital Holographic Interferometry for Phase Distribution Measurementp. 177
5.3.1 Measurement Principle of Digital Holographic Interferometryp. 177
5.3.1.1 Principle of Phase Measurement of the Object Wave Fieldp. 178
5.3.1.2 Principle of Digital Holographic Interferometryp. 180
5.3.2 Applications of Digital Holographic Interferometry in Surface Profile Testing of MEMS/MOEMSp. 183
5.3.3 Applications of Digital Holographic Interferometry in Measuring Refractive Index Distributionp. 185
5.3.3.1 Measurement of Light-Induced Index Change in Photorefractive Crystalsp. 186
5.3.3.2 Measurement of Acoustic Standing Wave Fieldp. 191
5.3.3.3 Measurement of Plasma Plume Fieldp. 192
5.3.3.4 Measurement of Temperature Distribution in Air Fieldp. 193
5.3.3.5 Visualization Measurement of Turbulent Flow Field in Waterp. 194
Referencesp. 195
6 Conclusionp. 199
Indexp. 201