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Subject: Electronic apparatus and appliances -- Testing

Author

Genn, Robert C.

(2)

Kalai Selvan Subramaniam

(2)

Breitenstein, O.

(1)

Breuer, Melvin A

(1)

Chan, H. Anthony, 1952-

(1)

Cortner, J. Max

(1)

Douglas-Young, John

(1)

(1)

Englert, Paul J., 1960-

(1)

Farkas, Lucien L.

(1)

Friedman, Arthur D.

(1)

Goodman, Robert L.

(1)

Grolle, Carl G.

(1)

Horn, Delton T.

(1)

Ireland, David, 1957-

(1)

Kececioglu, Dimitri

(1)

(1)

(1)

(1)

(1)

Nadeau-Dostie, Benoit

(1)

Sheppard, John W.

(1)

(1)

Simpson, William Randolph

(1)

Stevens, Anthony K.

(1)

(1)

Turner, Rufus P.

(1)

Waller, William F.

(1)

(1)

Witte, Robert A.

(1)

Language

(25)

Format

(24)

(1)

Visual Materials

(1)

Material Type

Closed Access Computer File

Closed Access Thesis

Non Circulating Microfilm

Open Access Book

Restricted and Confidential Materials

Subject

Electronic apparatus and appliances -- Maintenance and repair

(6)

Electronic measurements

(5)

Automatic checkout equipment

(3)

Electronic instruments

(3)

Digital electronics

(2)

Electronic apparatus and appliances -- Reliability

(2)

Environmental testing

(2)

Integrated circuits

(2)

Motorola 68HC11E9 (Microprocessor)

(2)

(1)

Electronic apparatus and appliances -- Design and construction

(1)

Electronic apparatus and appliances -- Maintenance and repair -- Congresses

(1)

Electronic apparatus and appliances -- Thermal properties

(1)

Electronic circuit design

(1)

Electronic circuits -- Testing

(1)

Fault-tolerant computing

(1)

Integrated circuits -- Testing

(1)

Semiconductors -- Thermal properties

(1)

Signal processing -- Statistical methods

(1)

(1)

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1.

Cover image for Lock-in thermography : basics and use for evaluating electronic devices and materials

Lock-in thermography : basics and use for evaluating electronic devices and materials

by

Breitenstein, O.

Author

Breitenstein, O., Warta, W., Langenkamp, M.

Format:

Call Number

TK7870.25 B74 2010

Edition

2nd ed.

Publisher

Springer,

Publication Date

2010

ISBN

9783642024160

Available:
Holds:
Copies:

SD_ILS:639928

2.

Cover image for A signal integrity engineer's companion : real-time test and measurement and design simulation

A signal integrity engineer's companion : real-time test and measurement and design simulation

by

Lawday, Geoff

Author

Lawday, Geoff, Ireland, David, 1957-, Edlund, Greg

Format:

Call Number

TK7870.23 L38 2008

Publisher

Pearson Education,

Publication Date

2008

ISBN

9780131860063

Available:
Holds:
Copies:

SD_ILS:339551

3.

Cover image for Electronic test instruments

Electronic test instruments

by

Witte, Robert A.

Author

Witte, Robert A.

Format:

Call Number

TK7878.4 W574 2002

Edition

2nd ed.

Publisher

Prentice Hall,

Publication Date

2002

ISBN

9780130668301

Available:
Holds:
Copies:

SD_ILS:110955

4.

Cover image for Accelerated stress testing handbook : guide for achieving quality products

Accelerated stress testing handbook : guide for achieving quality products

by

Chan, H. Anthony, 1952-

Author

Chan, H. Anthony, 1952-, Englert, Paul J., 1960-

Format:

Call Number

TK7870.23 A22 2001

Publisher

IEEE Press,

Publication Date

2001

ISBN

9780780360259

Available:
Holds:
Copies:

SD_ILS:371006

5.

Cover image for Design for at - speed test, diagnosis and measurement

Design for at - speed test, diagnosis and measurement

by

Nadeau-Dostie, Benoit

Author

Nadeau-Dostie, Benoit

Format:

Call Number

TK7874 D42 2000

Publisher

Kluwer Academic,

Publication Date

2000

ISBN

9780792386698

Available:
Holds:
Copies:

SD_ILS:166483

6.

Cover image for Feasibility study on ISSQ test as burn-in replacement for MC68HC11E9 device

Feasibility study on ISSQ test as burn-in replacement for MC68HC11E9 device

Feasibility study on ISSQ test as burn-in replacement for MC68HC11E9 device

by

Kalai Selvan Subramaniam

Author

Kalai Selvan Subramaniam

Format:

Call Number

TK7874 K35 1997

Publisher

UTM,

Publication Date

1997

Thesis (Master of Electrical Engineering) - Universiti Teknologi Malaysia, 1997

Restricted

Available:
Holds:
Copies:

SD_ILS:455523

7.

Cover image for Burn-in testing : its quantification and optimization

Burn-in testing : its quantification and optimization

Burn-in testing : its quantification and optimization

by

Kececioglu, Dimitri

Author

Kececioglu, Dimitri, Sun, Feng-Bin

Format:

Call Number

TK7870 K43 1997

Publisher

Prentice Hall,

Publication Date

1997

ISBN

9780133242119

Available:
Holds:
Copies:

SD_ILS:470906

8.

Cover image for Feasibility study on ISSQ test as burn-in replacement for MC68HC11E9 device

Feasibility study on ISSQ test as burn-in replacement for MC68HC11E9 device

Feasibility study on ISSQ test as burn-in replacement for MC68HC11E9 device

by

Kalai Selvan Subramaniam

Author

Kalai Selvan Subramaniam

Format:

Call Number

MFL 8964 ra

Publisher

UTM,

Publication Date

1997

Thesis (Master of Electrical Engineering) - Universiti Teknologi Malaysia, 1997

Available:
Holds:
Copies:

SD_ILS:7601

9.

Cover image for System test and diagnosis

System test and diagnosis

by

Simpson, William Randolph

Author

Simpson, William Randolph, Sheppard, John W.

Format:

Call Number

TK7870.2 S55 1994

Publisher

Kluwer Academic Pub,

Publication Date

1994

ISBN

9780792394754

Available:
Holds:
Copies:

SD_ILS:461029

10.

Cover image for How to test almost everything electronic

How to test almost everything electronic

by

Horn, Delton T.

Author

Horn, Delton T.

Format:

Call Number

TK7878.H67 1993

Edition

3rd ed

Publisher

TAB Books,

Publication Date

1993

ISBN

9780830641284

Available:
Holds:
Copies:

SD_ILS:364297

11.

Cover image for Manual of electronic servicing tests and measurements

Manual of electronic servicing tests and measurements

Manual of electronic servicing tests and measurements

by

Genn, Robert C.

Author

Genn, Robert C.

Format:

Call Number

TK7870.G46 1990

Edition

2nd ed.

Publisher

Prentice-Hall,

Publication Date

1990

ISBN

9780135563335

Available:
Holds:
Copies:

SD_ILS:93072

12.

Cover image for Digital test engineering

Digital test engineering

Digital test engineering

by

Cortner, J. Max

Author

Cortner, J. Max

Format:

Call Number

TK7868.D5 C66 1987

Publisher

John Wiley,

Publication Date

1987

ISBN

9780471851356

Available:
Holds:
Copies:

SD_ILS:456966

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