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1. 
Cover image for Testability method at register transfer level (RTL) and gate level
2. 
Cover image for Testability method at register transfer level (RTL) and gate level
3. 
Cover image for Functional test generation using micro operation fault model
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Cover image for Test pattern generation for path delay fault using stuck-at fault automatic test pattern generator
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Cover image for Kajian sistem kerangka keluli dan teras konkrit bertetulang bangunan tinggi analisis unsur terhingga tidak lelurus
6. 
Cover image for IC test based on scan cell
7. 
Cover image for Design for at - speed test, diagnosis and measurement
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Cover image for Random power supply as a test vector to expose soft defects in CMOS digital circuits
9. 
Cover image for Reka bentuk untuk pengujian 2 ... [et al.]
10. 
Cover image for Design to test : a definitive guide for electronic design, manufacture, and service
11. 
Cover image for Kaedah pernomboran dalam membandingkan kejayaan sistem pengesan terus dan pengesan jelas dalam sistem perhubungan optik; Pemprosesan imej digital; Penyelakuan sistem kawalan taklelurus dengan data tersampel; Point on wave switch; Model komputer untuk sistem perhubungan optik; MC6800 based programmable digital integrated circuit tester; Implementation of X.25 Datagram for a personal computer
12. 
Cover image for Compatibility and testing of electronic components