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Digital integrated circuits -- Testing
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1. 
Cover image for Principles of semiconductor network testing
2. 
Cover image for Compatibility and testing of electronic components
3. 
Cover image for Wafer-level testing and test during burn-in for integrated circuits / Sudarshan Bahukudumbi, Krishnendu Chakrabarty
4. 
Cover image for An engineer's guide to automated testing of high-speed interfaces
5. 
Cover image for Design for in-situ chip testing with a compact tester
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Cover image for Testability method at register transfer level (RTL) and gate level
7. 
Cover image for Testability method at register transfer level (RTL) and gate level
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Cover image for Functional test generation using micro operation fault model
9. 
Cover image for Functional test generation using micro operation fault model
10. 
Cover image for Test pattern generation for path delay fault using stuck-at fault automatic test pattern generator
11. 
Cover image for ESD : failure mechanisms and models
12. 
Cover image for Nanometer technology designs : high quality delay tests
13. 
Cover image for Kajian sistem kerangka keluli dan teras konkrit bertetulang bangunan tinggi analisis unsur terhingga tidak lelurus
14. 
Cover image for IC test based on scan cell
15. 
Cover image for Design for testtability (DFT), based on ad-hoc philosphy
16. 
Cover image for Pembinaan dan penilaian sistem pengurusan rekod stor bengkel sekolah menengah teknik berasaskan web (SISTOR)
17. 
Cover image for Design for at - speed test, diagnosis and measurement
18. 
Cover image for Random power supply as a test vector to expose soft defects in CMOS digital circuits
19. 
Cover image for Pengujian litar digital
20. 
Cover image for Pengujian litar digital ... [et al.]
21. 
Cover image for Reka bentuk untuk pengujian 2 ... [et al.]
22. 
Cover image for Reka bentuk untuk pengujian 2
23. 
Cover image for Design to test : a definitive guide for electronic design, manufacture, and service
24. 
Cover image for Kaedah pernomboran dalam membandingkan kejayaan sistem pengesan terus dan pengesan jelas dalam sistem perhubungan optik; Pemprosesan imej digital; Penyelakuan sistem kawalan taklelurus dengan data tersampel; Point on wave switch; Model komputer untuk sistem perhubungan optik; MC6800 based programmable digital integrated circuit tester; Implementation of X.25 Datagram for a personal computer
25. 
Cover image for MC6800 based programmable digital integrated circuit tester