Title:
Instrumentation, metrology, and standards for nanomanufacturing II : 10 August 2008, San Diego, California, USA
Series:
Proceedings of SPIE--the International Society for Optical Engineering ; v. 7042
Publication Information:
Washington : SPIE, 2008
Physical Description:
1 v. (various pagings) : ill. ; 28 cm.
ISBN:
9780819472625
Added Corporate Author:
Available:*
Library | Item Barcode | Call Number | Material Type | Item Category 1 | Status |
---|---|---|---|---|---|
Searching... | 30000010215762 | TA418.9.N35 I57 2008 | Open Access Book | Book | Searching... |
On Order
Summary
Summary
Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.