Title:
Two- and three-dimensional methods for inspection and metrology VI
Series:
Proceedings of SPIE ; v. 7066
Publication Information:
Bellingham, WA : SPIE, 2008
Physical Description:
1 v. (unpaged) : ill. ; 28 cm.
ISBN:
9780819472861
Added Author:
Added Corporate Author:
Added Conference Author:
Available:*
Library | Item Barcode | Call Number | Material Type | Item Category 1 | Status |
|---|---|---|---|---|---|
Searching... | 30000010210374 | TA1634 T86 2008 | Open Access Book | Proceedings, Conference, Workshop etc. | Searching... |
On Order
Summary
Summary
Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.
