Emerging nanotechnologies : test, defect tolerance, and reliability

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Title:

Series:

Frontiers in electronic testing ; 37

Publication Information:

New York, NY : Springer, 2008

Physical Description:

xii, 405 p. : ill. ; 24 cm.

ISBN:

9780387747460

Subject Term:

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Library	Item Barcode	Call Number	Material Type	Item Category 1	Status
Searching... PSZ JB	30000010179525	T174.7 E43 2008	Open Access Book	Book	Searching... Unknown